Keith Bowman
Keith Bowman
Qualcomm; Intel; Georgia Institute of Technology
Verified email at qti.qualcomm.com
Title
Cited by
Cited by
Year
Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration
KA Bowman, SG Duvall, JD Meindl
IEEE Journal of solid-state circuits 37 (2), 183-190, 2002
9002002
Energy-efficient and metastability-immune resilient circuits for dynamic variation tolerance
KA Bowman, JW Tschanz, NS Kim, JC Lee, CB Wilkerson, SLL Lu, ...
IEEE Journal of Solid-State Circuits 44 (1), 49-63, 2008
3742008
A 45 nm resilient microprocessor core for dynamic variation tolerance
KA Bowman, JW Tschanz, SLL Lu, PA Aseron, MM Khellah, ...
IEEE Journal of Solid-State Circuits 46 (1), 194-208, 2010
2802010
A physical alpha-power law MOSFET model
KA Bowman, BL Austin, JC Eble, X Tang, JD Meindl
Proceedings of the 1999 international symposium on Low power electronics and …, 1999
1851999
Impact of parameter variations on circuits and microarchitecture
OS Unsal, JW Tschanz, K Bowman, V De, X Vera, A Gonzalez, O Ergin
Ieee Micro 26 (6), 30-39, 2006
1602006
Tunable replica circuits and adaptive voltage-frequency techniques for dynamic voltage, temperature, and aging variation tolerance
J Tschanz, K Bowman, S Walstra, M Agostinelli, T Karnik, V De
2009 Symposium on VLSI Circuits, 112-113, 2009
1562009
Within-die variation-aware dynamic-voltage-frequency-scaling with optimal core allocation and thread hopping for the 80-core teraflops processor
S Dighe, SR Vangal, P Aseron, S Kumar, T Jacob, KA Bowman, J Howard, ...
IEEE Journal of Solid-State Circuits 46 (1), 184-193, 2010
1482010
Circuit techniques for dynamic variation tolerance
K Bowman, J Tschanz, C Wilkerson, SL Lu, T Karnik, V De, S Borkar
2009 46th ACM/IEEE Design Automation Conference, 4-7, 2009
1422009
Impact of extrinsic and intrinsic parameter fluctuations on CMOS circuit performance
KA Bowman, X Tang, JC Eble, JD Menldl
IEEE Journal of Solid-State Circuits 35 (8), 1186-1193, 2000
1022000
Energy-efficient and metastability-immune timing-error detection and instruction-replay-based recovery circuits for dynamic-variation tolerance
KA Bowman, JW Tschanz, NS Kim, JC Lee, CB Wilkerson, SLL Lu, ...
2008 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2008
942008
A minimum total power methodology for projecting limits on CMOS GSI
AJ Bhavnagarwala, BL Austin, KA Bowman, JD Meindl
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 8 (3), 235-251, 2000
932000
Variation-tolerant circuits: circuit solutions and techniques
J Tschanz, K Bowman, V De
Proceedings of the 42nd annual Design Automation Conference, 762-763, 2005
822005
Impact of die-to-die and within-die parameter variations on the throughput distribution of multi-core processors
KA Bowman, AR Alameldeen, ST Srinivasan, CB Wilkerson
Proceedings of the 2007 international symposium on Low power electronics and …, 2007
782007
A 45nm resilient and adaptive microprocessor core for dynamic variation tolerance
J Tschanz, K Bowman, SL Lu, P Aseron, M Khellah, A Raychowdhury, ...
2010 IEEE International Solid-State Circuits Conference-(ISSCC), 282-283, 2010
752010
Optimal n-tier multilevel interconnect architectures for gigascale integration (GSI)
R Venkatesan, JA Davis, KA Bowman, JD Meindl
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 9 (6), 899-912, 2001
742001
Within-die variation-aware dynamic-voltage-frequency scaling core mapping and thread hopping for an 80-core processor
S Dighe, S Vangal, P Aseron, S Kumar, T Jacob, K Bowman, J Howard, ...
2010 IEEE International Solid-State Circuits Conference-(ISSCC), 174-175, 2010
732010
Impact of die-to-die and within-die parameter variations on the clock frequency and throughput of multi-core processors
KA Bowman, AR Alameldeen, ST Srinivasan, CB Wilkerson
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 17 (12 …, 2009
732009
PVT-and-aging adaptive wordline boosting for 8T SRAM power reduction
A Raychowdhury, B Geuskens, J Kulkarni, J Tschanz, K Bowman, ...
2010 IEEE International Solid-State Circuits Conference-(ISSCC), 352-353, 2010
722010
A 22 nm all-digital dynamically adaptive clock distribution for supply voltage droop tolerance
KA Bowman, C Tokunaga, T Karnik, VK De, JW Tschanz
IEEE Journal of Solid-State Circuits 48 (4), 907-916, 2013
622013
Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage
A Keshavarzi, G Schrom, S Tang, S Ma, K Bowman, S Tyagi, K Zhang, ...
Proceedings of the 2005 international symposium on Low power electronics and …, 2005
592005
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Articles 1–20