Follow
Sobeeh Almukhaizim
Sobeeh Almukhaizim
Associate Professor of Computer Engineering, Kuwait University
Verified email at ku.edu.kw
Title
Cited by
Cited by
Year
Soft error mitigation through selective addition of functionally redundant wires
S Almukhaizim, Y Makris
IEEE Transactions on Reliability 57 (1), 23-31, 2008
742008
Entropy-driven parity-tree selection for low-overhead concurrent error detection in finite state machines
S Almukhaizim, P Drineas, Y Makris
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2006
542006
Seamless integration of SER in rewiring-based design space exploration
S Almukhaizim, Y Makris, YS Yang, A Veneris
2006 IEEE International Test Conference, 1-9, 2006
532006
Concurrent error detection methods for asynchronous burst-mode machines
S Almukhaizim, Y Makris
IEEE Transactions on Computers 56 (6), 785-798, 2007
422007
Fusing multiple color images for texturing models
N Bannai, A Agathos, RB Fisher
Proceedings. 2nd International Symposium on 3D Data Processing …, 2004
382004
Peak power reduction through dynamic partitioning of scan chains
S Almukhaizim, O Sinanoglu
2008 IEEE International Test Conference, 1-10, 2008
322008
Fault tolerant design of combinational and sequential logic based on a parity check code
S Almukhaizim, Y Makris
Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI …, 2003
272003
Circuit and method providing dynamic scan chain partitioning
SA Almukhaizim, O Sinanoglu
US Patent 7,937,634, 2011
262011
Dynamic scan chain partitioning for reducing peak shift power during test
S Almukhaizim, O Sinanoglu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2009
262009
Novel hazard-free majority voter for N-modular redundancy-based fault tolerance in asynchronous circuits
S Almukhaizim, O Sinanoglu
IET Computers & Digital Techniques 5 (4), 306-315, 2011
222011
Cost-effective graceful degradation in speculative processor subsystems: The branch prediction case
S Almukhaizim, T Verdel, Y Makris
Proceedings 21st International Conference on Computer Design, 194-197, 2003
212003
Low-cost, software-based self-test methodologies for performance faults in processor control subsystems
S Almukhaizim, P Petrov, A Orailoglu
Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No …, 2001
212001
Faults in processor control subsystems: Testing correctness and performance faults in the data prefetching unit
S Almukhaizim, P Petrov, A Orailoglu
Proceedings 10th Asian Test Symposium, 319-324, 2001
192001
Cost-driven selection of parity trees
S Almukhaizim, P Drineas, Y Makris
22nd IEEE VLSI Test Symposium, 2004. Proceedings., 319-324, 2004
182004
On concurrent error detection with bounded latency in FSMs
S Almukhaizim, P Drineas, Y Makris
Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004
182004
Soft-error tolerance and mitigation in asynchronous burst-mode circuits
S Almukhaizim, F Shi, E Love, Y Makris
IEEE transactions on very large scale integration (VLSI) systems 17 (7), 869-882, 2009
162009
X-align: Improving the scan cell observability of response compactors
O Sinanoglu, S Almukhaizim
IEEE transactions on very large scale integration (VLSI) systems 17 (10 …, 2009
152009
A hazard-free majority voter for TMR-based fault tolerance in asynchronous circuits
S Almukhaizim, O Sinanoglu
2007 2nd International Design and Test Workshop, 93-98, 2007
152007
Circuit and method for increasing scan cell observability of response compactors
O Sinanoglu, SA Almukhaizim
US Patent 8,006,150, 2011
142011
Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG
J Ma, M Tehranipoor, O Sinanoglu, S Almukhaizim
2010 5th International Design and Test Workshop, 122-127, 2010
142010
The system can't perform the operation now. Try again later.
Articles 1–20