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Brian Cline
Brian Cline
Founder, entrepreneur: Stealth-mode startup
Verified email at lumoniq.com
Title
Cited by
Cited by
Year
ASAP7: A 7-nm finFET predictive process design kit
LT Clark, V Vashishtha, L Shifren, A Gujja, S Sinha, B Cline, ...
Microelectronics Journal 53, 105-115, 2016
4772016
Exploring sub-20nm FinFET design with predictive technology models
S Sinha, G Yeric, V Chandra, B Cline, Y Cao
Proceedings of the 49th Annual Design Automation Conference, 283-288, 2012
3692012
Exploring variability and performance in a sub-200-mV processor
S Hanson, B Zhai, M Seok, B Cline, K Zhou, M Singhal, M Minuth, J Olson, ...
IEEE Journal of Solid-State Circuits 43 (4), 881-891, 2008
1942008
Analysis and modeling of CD variation for statistical static timing
B Cline, K Chopra, D Blaauw, Y Cao
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided …, 2006
1082006
Performance and variability optimization strategies in a sub-200mV, 3.5 pJ/inst, 11nW subthreshold processor
S Hanson, B Zhai, M Seok, B Cline, K Zhou, M Singhal, M Minuth, J Olson, ...
2007 IEEE Symposium on VLSI Circuits, 152-153, 2007
1012007
Correlated electron switch programmable fabric
L Shifren, G Yeric, S Sinha, B Cline, V Chandra
US Patent 10,056,143, 2018
922018
Self-aligned double patterning aware pin access and standard cell layout co-optimization
X Xu, B Cline, G Yeric, B Yu, DZ Pan
Proceedings of the 2014 on International symposium on physical design, 101-108, 2014
832014
Computer implemented system and method for generating a layout of a cell defining a circuit component
P De Dood, MW Frederick, JC Wang, BDN Lee, BT Cline, X Xu, AW Chen, ...
US Patent 10,083,269, 2018
772018
Cascade2D: A design-aware partitioning approach to monolithic 3D IC with 2D commercial tools
K Chang, S Sinha, B Cline, R Southerland, M Doherty, G Yeric, SK Lim
2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2016
632016
Buried Power Rails and Back-side Power Grids: Arm® CPU Power Delivery Network Design Beyond 5nm
D Prasad, SST Nibhanupudi, S Das, O Zografos, B Chehab, S Sarkar, ...
2019 IEEE International Electron Devices Meeting (IEDM), 19.1. 1-19.1. 4, 2019
622019
Standard cell library design and optimization methodology for ASAP7 PDK
X Xu, N Shah, A Evans, S Sinha, B Cline, G Yeric
2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 999 …, 2017
502017
Replacing copper interconnects with graphene at a 7-nm node
NC Wang, S Sinha, B Cline, CD English, G Yeric, E Pop
2017 IEEE International Interconnect Technology Conference (IITC), 1-3, 2017
432017
Design benchmarking to 7nm with FinFET predictive technology models
S Sinha, B Cline, G Yeric, V Chandra, Y Cao
Proceedings of the 2012 ACM/IEEE international symposium on Low power …, 2012
392012
Physical design and FinFETs
R Aitken, G Yeric, B Cline, S Sinha, L Shifren, I Iqbal, V Chandra
Proceedings of the 2014 on International symposium on physical design, 65-68, 2014
382014
32-bit processor core at 5-nm technology: Analysis of transistor and interconnect impact on VLSI system performance
CS Lee, B Cline, S Sinha, G Yeric, HSP Wong
2016 IEEE international electron devices meeting (IEDM), 28.3. 1-28.3. 4, 2016
372016
Stress aware layout optimization
V Joshi, B Cline, D Sylvester, D Blaauw, K Agarwal
Proceedings of the 2008 international symposium on Physical design, 168-174, 2008
362008
Circuit and method for configurable impedance array
AJ Bhavnagarwala, V Chandra, BT Cline
US Patent 9,773,550, 2017
322017
Predictive simulation and benchmarking of Si and Ge pMOS FinFETs for future CMOS technology
L Shifren, R Aitken, AR Brown, V Chandra, B Cheng, C Riddet, ...
IEEE Transactions on Electron Devices 61 (7), 2271-2277, 2014
322014
The past present and future of design-technology co-optimization
G Yeric, B Cline, S Sinha, D Pietromonaco, V Chandra, R Aitken
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 1-8, 2013
292013
Leakage power reduction using stress-enhanced layouts
V Joshi, B Cline, D Sylvester, D Blaauw, K Agarwal
Proceedings of the 45th annual Design Automation Conference, 912-917, 2008
282008
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