‪Hyuck Lee‬ - ‪Google Scholar‬

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Co-authors

Seungjae ShinKorea Advanced Institute of Science and TechnologyVerified email at kaist.ac.kr

Hyuck Lee

Hyuck Lee

Korea Advanced Institute of Science and Technology

Verified email at kaist.ac.kr - Homepage

Artificial Intelligance class imbalanced learning


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Abc: Auxiliary balanced classifier for class-imbalanced semi-supervised learning H Lee, S Shin, H Kim Advances in Neural Information Processing Systems 34, 7082-7094, 2021	72	2021
Semi-supervised multi-label learning for classification of wafer bin maps with mixed-type defect patterns H Lee, H Kim IEEE Transactions on Semiconductor Manufacturing 33 (4), 653-662, 2020	44	2020
Semi-supervised learning for simultaneous location detection and classification of mixed-type defect patterns in wafer bin maps H Lee, J Lee, H Kim IEEE Transactions on Semiconductor Manufacturing 36 (2), 220-230, 2023	7	2023
CDMAD: Class-Distribution-Mismatch-Aware Debiasing for Class-Imbalanced Semi-Supervised Learning H Lee, H Kim arXiv preprint arXiv:2403.10391, 2024	1	2024
Classification of Chip-level Defect Types in Wafer Bin Maps Using Only Wafer-level Labels H Kim, H Kim Journal of Manufacturing Science and Engineering 146, 070902-1, 2024		2024

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