| Fault masking ratio analysis of majority voters topologies IFV Oliveira, RB Schvittz, PF Butzen 2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018 | 12 | 2018 |
| Single event transient sensitivity analysis of different 32 nm CMOS majority voters designs IFV Oliveira, RB Schvittz, PF Butzen Microelectronics Reliability 100, 113369, 2019 | 8 | 2019 |
| Probabilistic method for reliability estimation of sp-networks considering single event transient faults R Schvittz, DT Franco, LS Rosa, PF Butzen 2018 25th IEEE International Conference on Electronics, Circuits and Systems …, 2018 | 7 | 2018 |
| Survey on reliability estimation in digital circuits MF Pontes, C Farias, R Schvittz, P Butzen, L da Rosa Jr Journal of Integrated Circuits and Systems 16 (3), 1-11, 2021 | 6 | 2021 |
| The suitability of the spr-mp method to evaluate the reliability of logic circuits MF Pontes, PF Butzen, RB Schvittz, SL Rosa, DT Franco 2018 25th IEEE International Conference on Electronics, Circuits and Systems …, 2018 | 6 | 2018 |
| Comparing analytical and monte-carlo-based simulation methods for logic gates set sensitivity evaluation RB Schvittz, YQ Aguiar, F Wrobel, JL Autran, LS Rosa Jr, PF Butzen Microelectronics Reliability 114, 113871, 2020 | 4 | 2020 |
| A simplified layout-level method for single event transient faults susceptibility on logic gates R Schvittz, DT Franco, L Soares, PF Butzen 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration …, 2019 | 4 | 2019 |
| The impact of logic gates susceptibility in overall circuit reliability analysis MF Pontes, IFV Oliveira, RB Schvittz, LS Rosa, PF Butzen 2022 IEEE International Symposium on Circuits and Systems (ISCAS), 1610-1614, 2022 | 3 | 2022 |
| Methods for susceptibility analysis of logic gates in the presence of single event transients RB Schvittz, PF Butzen, LS da Rosa 2020 IEEE International Test Conference (ITC), 1-9, 2020 | 3 | 2020 |
| Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method CR Farias, RB Schvittz, TR Balen, PF Butzen 2022 IEEE 23rd Latin American Test Symposium (LATS), 1-6, 2022 | 2 | 2022 |
| Reliability evaluation of voters for fault tolerant approximate systems TR Balen, CJ González, IFV Oliveira, RB Schvittz, N Added, ... 2021 IEEE 22nd Latin American Test Symposium (LATS), 1-6, 2021 | 2 | 2021 |
| Exploring logic gates layout to improve the accuracy of circuit reliability estimation R Schvittz, L Soares, PF Butzen 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration …, 2019 | 2 | 2019 |
| Fault tolerance evaluation of different majority voter designs IFV Oliveira, MF Pontes, RB Schvittz, LS Rosa, PF Butzen, RI Soares 2022 IEEE International Symposium on Circuits and Systems (ISCAS), 185-189, 2022 | 1 | 2022 |
| An improved technique for logic gate susceptibility evaluation of single event transient faults RB Schvittz, DT Franco, LS da Rosa, PF Butzen VLSI-SoC: New Technology Enabler: 27th IFIP WG 10.5/IEEE International …, 2020 | 1 | 2020 |
| Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems TR Balen, CJ González, IFV Oliveira, LS da Rosa Jr, RI Soares, ... Journal of Electronic Testing 39 (4), 409-420, 2023 | | 2023 |
| Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation BB Sandoval, LH Brendler, FL Kastensmidt, R Reis, AL Zimpeck, ... 2023 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2023 | | 2023 |
| Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing RNM Oliveira, FGRG da Silva, R Reis, RB Schvittz, C Meinhardt 2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems …, 2022 | | 2022 |
| CREsT-Uma Ferramenta para o Auxílio do Ensino de Confiabilidade em Circuitos Digitais LQ Jurgina, MF Pontes, CR Farias, G Manske, RB Schvittz, PF Butzen, ... Anais do XXXII Simpósio Brasileiro de Informática na Educação, 191-202, 2021 | | 2021 |
| Análise da suscetibilidade de portas lógicas na presença de falhas de efeitos singulares RB Schvittz Universidade Federal de Pelotas, 2020 | | 2020 |
| Reliability evaluation of circuits designed in multi-and single-stage versions RB Schvittz, M Pontes, C Meinhardt, DT Franco, L Naviner, LS da Rosa, ... 2018 IEEE 9th Latin American Symposium on Circuits & Systems (LASCAS), 1-4, 2018 | | 2018 |
