Follow
kris iniewski
kris iniewski
redlen
Verified email at redlen.com
Title
Cited by
Cited by
Year
Noncontact wafer probe using wireless probe cards
CV Sellathamby, MM Reja, L Fu, B Bai, E Reid, SH Slupsky, IM Filanovsky, ...
IEEE International Conference on Test, 2005., 6 pp.-452, 2005
2972005
Error control coding in low-power wireless sensor networks: When is ECC energy-efficient?
SL Howard, C Schlegel, K Iniewski, K Iniewski
EURASIP Journal on Wireless Communications and Networking 2006, 1-14, 2006
2812006
CRC Press Boca Raton
K Iniewski, K Yallup
FL, USA, 2013
2652013
Smart grid applications, communications, and security
LT Berger, K Iniewski
John Wiley & Sons, 2012
1782012
Characterization of large cadmium zinc telluride crystals grown by traveling heater method
H Chen, SA Awadalla, K Iniewski, PH Lu, F Harris, J Mackenzie, ...
Journal of Applied Physics 103 (1), 2008
1762008
Medical imaging: principles, detectors, and electronics
K Iniewski
John Wiley & Sons, 2009
1612009
Measurements of charge sharing in small pixel CdTe detectors
MC Veale, SJ Bell, DD Duarte, A Schneider, P Seller, MD Wilson, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2014
1262014
Mems: fundamental technology and applications
V Choudhary, K Iniewski
CRC Press, 2017
1042017
CZT detector technology for medical imaging
K Iniewski
Journal of Instrumentation 9 (11), C11001, 2014
1032014
VLSI circuits for biomedical applications
K Iniewski
Artech House, 2008
982008
Wireless technologies: circuits, systems, and devices
K Iniewski
CRC press, 2017
952017
Modeling charge-sharing effects in pixellated CZT detectors
K Iniewski, H Chen, G Bindley, I Kuvvetli, C Budtz-Jorgensen
2007 IEEE Nuclear Science Symposium Conference Record 6, 4608-4611, 2007
932007
Radiation effects in semiconductors
K Iniewski
CRC press, 2018
872018
Smart sensors for industrial applications
K Iniewski
CRC Press, 2017
712017
CZT sensors for Computed Tomography: From crystal growth to image quality
K Iniewski
Journal of Instrumentation 11 (12), C12034, 2016
692016
New technique for the characterization of Si/SiGe layers using heterostructure MOS capacitors
SP Voinigescu, K Iniewski, R Lisak, CAT Salama, JP Noel, DC Houghton
Solid-state electronics 37 (8), 1491-1501, 1994
681994
Characterisation of Redlen high-flux CdZnTe
B Thomas, MC Veale, MD Wilson, P Seller, A Schneider, K Iniewski
Journal of Instrumentation 12 (12), C12045, 2017
652017
Recent advances and future trends in low power wireless systems for medical applications
KA Townsend, JW Haslett, TKK Tsang, MN El-Gamal, K Iniewski
Fifth International Workshop on System-on-Chip for Real-Time Applications …, 2005
622005
MOS varactor structure with engineered voltage control range
K Iniewski, SC Magierowski
US Patent 6,407,412, 2002
622002
Analytical modeling of threshold voltages in p-channel Si/SiGe/Si MOS structures
K Iniewski, S Voinigescu, J Atcha, CAT Salama
Solid-state electronics 36 (5), 775-783, 1993
611993
The system can't perform the operation now. Try again later.
Articles 1–20