متابعة
barbara de salvo
barbara de salvo
CEA LETI
بريد إلكتروني تم التحقق منه على cea.fr
عنوان
عدد مرات الاقتباسات
عدد مرات الاقتباسات
السنة
Phase change memory as synapse for ultra-dense neuromorphic systems: Application to complex visual pattern extraction
M Suri, O Bichler, D Querlioz, O Cueto, L Perniola, V Sousa, D Vuillaume, ...
2011 International Electron Devices Meeting, 4.4. 1-4.4. 4, 2011
3632011
A stacked SONOS technology, up to 4 levels and 6nm crystalline nanowires, with gate-all-around or independent gates (Φ-Flash), suitable for full 3D integration
A Hubert, E Nowak, K Tachi, V Maffini-Alvaro, C Vizioz, C Arvet, ...
2009 IEEE International Electron Devices Meeting (IEDM), 1-4, 2009
3162009
Bio-inspired stochastic computing using binary CBRAM synapses
M Suri, D Querlioz, O Bichler, G Palma, E Vianello, D Vuillaume, ...
IEEE Transactions on Electron Devices 60 (7), 2402-2409, 2013
2662013
HfO2-Based OxRAM Devices as Synapses for Convolutional Neural Networks
D Garbin, E Vianello, O Bichler, Q Rafhay, C Gamrat, G Ghibaudo, ...
IEEE Transactions on Electron Devices 62 (8), 2494-2501, 2015
2252015
Visual pattern extraction using energy-efficient “2-PCM synapse” neuromorphic architecture
O Bichler, M Suri, D Querlioz, D Vuillaume, B DeSalvo, C Gamrat
IEEE Transactions on Electron Devices 59 (8), 2206-2214, 2012
2142012
Experimental and theoretical investigation of nano-crystal and nitride-trap memory devices
B De Salvo, G Ghibaudo, G Pananakakis, P Masson, T Baron, N Buffet, ...
IEEE Transactions on Electron Devices 48 (8), 1789-1799, 2001
1782001
CBRAM devices as binary synapses for low-power stochastic neuromorphic systems: auditory (cochlea) and visual (retina) cognitive processing applications
M Suri, O Bichler, D Querlioz, G Palma, E Vianello, D Vuillaume, ...
2012 International Electron Devices Meeting, 10.3. 1-10.3. 4, 2012
1772012
Electrical behavior of phase-change memory cells based on GeTe
L Perniola, V Sousa, A Fantini, E Arbaoui, A Bastard, M Armand, ...
IEEE Electron Device Letters 31 (5), 488-490, 2010
1622010
Physical aspects of low power synapses based on phase change memory devices
M Suri, O Bichler, D Querlioz, B Traoré, O Cueto, L Perniola, V Sousa, ...
Journal of Applied Physics 112 (5), 2012
1602012
Understanding RRAM endurance, retention and window margin trade-off using experimental results and simulations
C Nail, G Molas, P Blaise, G Piccolboni, B Sklenard, C Cagli, M Bernard, ...
2016 IEEE International Electron Devices Meeting (IEDM), 4.5. 1-4.5. 4, 2016
1252016
How far will silicon nanocrystals push the scaling limits of NVMs technologies?
B De Salvo, C Gerardi, S Lombardo, T Baron, L Perniola, D Mariolle, ...
IEEE International Electron Devices Meeting 2003, 26.1. 1-26.1. 4, 2003
1162003
Silicon nanocrystal memories
S Lombardo, B De Salvo, C Gerardi, T Baron
Microelectronic Engineering 72 (1-4), 388-394, 2004
1102004
Experimental and theoretical study of electrode effects in HfO2 based RRAM
C Cagli, J Buckley, V Jousseaume, T Cabout, A Salaun, H Grampeix, ...
2011 International Electron Devices Meeting, 28.7. 1-28.7. 4, 2011
1082011
Performance and reliability features of advanced nonvolatile memories based on discrete traps (silicon nanocrystals, SONOS)
B De Salvo, C Gerardi, R van Schaijk, SA Lombardo, D Corso, ...
IEEE Transactions on Device and Materials Reliability 4 (3), 377-389, 2004
1042004
HfO2-Based RRAM: Electrode Effects, Ti/HfO2 Interface, Charge Injection, and Oxygen (O) Defects Diffusion Through Experiment and Ab Initio Calculations
B Traoré, P Blaise, E Vianello, L Perniola, B De Salvo, Y Nishi
IEEE Transactions on Electron Devices 63 (1), 360-368, 2015
992015
Carbon-doped GeTe: a promising material for phase-change memories
GB Beneventi, L Perniola, V Sousa, E Gourvest, S Maitrejean, JC Bastien, ...
Solid-State Electronics 65, 197-204, 2011
982011
Variability-tolerant convolutional neural network for pattern recognition applications based on OxRAM synapses
D Garbin, O Bichler, E Vianello, Q Rafhay, C Gamrat, L Perniola, ...
2014 IEEE international electron devices meeting, 28.4. 1-28.4. 4, 2014
922014
Experimental and theoretical investigation of nonvolatile memory data-retention
B De Salvo, G Ghibaudo, G Pananakakis, G Reimbold, F Mondond, ...
IEEE Transactions on Electron Devices 46 (7), 1518-1524, 1999
891999
On the Origin of Low-Resistance State Retention Failure in HfO2-Based RRAM and Impact of Doping/Alloying
B Traoré, P Blaise, E Vianello, H Grampeix, S Jeannot, L Perniola, ...
IEEE Transactions on Electron Devices 62 (12), 4029-4036, 2015
872015
Novel Si-based nanowire devices: Will they serve ultimate MOSFETs scaling or ultimate hybrid integration?
T Ernst, L Duraffourg, C Dupre, E Bernard, P Andreucci, S Becu, E Ollier, ...
2008 IEEE International Electron Devices Meeting, 1-4, 2008
862008
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مقالات 1–20