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Co-authors
- Xiaohang LiAssociate Professor, Advanced Semiconductor Lab, ECE, KAUST, Saudi ArabiaVerified email at kaust.edu.sa
- Yi LuUniversity of Wisconsin-Madison; King Abdullah University of Science and TechnologyVerified email at wisc.edu
- Kuang-Hui LiPrincipal Engineer at TSMC, ATMD EPIVerified email at kaust.edu.sa
- Ronghui LinKing Abdullah University of Science and TechnologyVerified email at kaust.edu.sa
- Peng HanProfessor, Department of Computer Science, UESTCVerified email at uestc.edu.cn
- Shibin KrishnaPost Doctoral Research Associate, Cardiff University, United KingdomVerified email at cardiff.ac.uk
- Jose Manuel TaboadaMs/Phd Electrical Engineering StudentVerified email at kaust.edu.sa
- Jae-Hyun RyouAssociate Professor, Mechanical Engineeering, University of HoustonVerified email at uh.edu
- Xinke LiuShenzhen UniversityVerified email at szu.edu.cn
- Zhe Chuan FengGuangxi UniversityVerified email at ntu.edu.tw