| Imaging of transient structures using nanosecond in situ TEM JS Kim, T LaGrange, BW Reed, ML Taheri, MR Armstrong, WE King, ... Science 321 (5895), 1472-1475, 2008 | 355 | 2008 |
| Atomic-scale microstructure of metal halide perovskite MU Rothmann, JS Kim, J Borchert, KB Lohmann, CM O’Leary, ... Science 370 (6516), eabb5940, 2020 | 210 | 2020 |
| Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM) T LaGrange, GH Campbell, BW Reed, M Taheri, JB Pesavento, JS Kim, ... Ultramicroscopy 108 (11), 1441-1449, 2008 | 164 | 2008 |
| Influence of shell thickness and surface passivation on PbS/CdS core/shell colloidal quantum dot solar cells DCJ Neo, C Cheng, SD Stranks, SM Fairclough, JS Kim, AI Kirkland, ... Chemistry of Materials 26 (13), 4004-4013, 2014 | 151 | 2014 |
| Practical considerations for high spatial and temporal resolution dynamic transmission electron microscopy MR Armstrong, K Boyden, ND Browning, GH Campbell, JD Colvin, ... Ultramicroscopy 107 (4-5), 356-367, 2007 | 131 | 2007 |
| Low-dose phase retrieval of biological specimens using cryo-electron ptychography L Zhou, J Song, JS Kim, X Pei, C Huang, M Boyce, L Mendonça, D Clare, ... Nature Communications 11 (1), 2773, 2020 | 110 | 2020 |
| Direct characterization of phase transformations and morphologies in moving reaction zones in Al/Ni nanolaminates using dynamic transmission electron microscopy JS Kim, T LaGrange, BW Reed, R Knepper, TP Weihs, ND Browning, ... Acta Materialia 59 (9), 3571-3580, 2011 | 93 | 2011 |
| In-situ electron microscopy: applications in physics, chemistry and materials science G Dehm, JM Howe, J Zweck John Wiley & Sons, 2012 | 82 | 2012 |
| Antimony thin films demonstrate programmable optical nonlinearity Z Cheng, T Milne, P Salter, JS Kim, S Humphrey, M Booth, H Bhaskaran Science advances 7 (1), eabd7097, 2021 | 59 | 2021 |
| Unusual stacking variations in liquid-phase exfoliated transition metal dichalcogenides A Shmeliov, M Shannon, P Wang, JS Kim, E Okunishi, PD Nellist, K Dolui, ... ACS nano 8 (4), 3690-3699, 2014 | 54 | 2014 |
| The development of a 200 kV monochromated field emission electron source M Mukai, JS Kim, K Omoto, H Sawada, A Kimura, A Ikeda, J Zhou, ... Ultramicroscopy 140, 37-43, 2014 | 47 | 2014 |
| Controlled radiation damage and edge structures in boron nitride membranes JS Kim, KB Borisenko, V Nicolosi, AI Kirkland ACS nano 5 (5), 3977-3986, 2011 | 43 | 2011 |
| Quantifying transient states in materials with the dynamic transmission electron microscope GH Campbell, T LaGrange, JS Kim, BW Reed, ND Browning Journal of electron microscopy 59 (S1), S67-S74, 2010 | 31 | 2010 |
| Applications of deep learning in electron microscopy KP Treder, C Huang, JS Kim, AI Kirkland Microscopy 71 (Supplement_1), i100-i115, 2022 | 30 | 2022 |
| Laser‐based in situ techniques: Novel methods for generating extreme conditions in TEM samples ML Taheri, T Lagrange, BW Reed, MR Armstrong, GH Campbell, ... Microscopy research and technique 72 (3), 122-130, 2009 | 30 | 2009 |
| Temperature dependence of atomic vibrations in mono-layer graphene CS Allen, E Liberti, JS Kim, Q Xu, Y Fan, K He, AW Robertson, ... Journal of Applied Physics 118 (7), 074302, 2015 | 25 | 2015 |
| Impurity induced non-bulk stacking in chemically exfoliated h-BN nanosheets A Shmeliov, JS Kim, KB Borisenko, P Wang, E Okunishi, M Shannon, ... Nanoscale 5 (6), 2290-2294, 2013 | 23 | 2013 |
| Cryogenic electron ptychographic single particle analysis with wide bandwidth information transfer X Pei, L Zhou, C Huang, M Boyce, JS Kim, E Liberti, Y Hu, T Sasaki, ... Nature Communications 14 (1), 3027, 2023 | 11 | 2023 |
| Formation of klein edge doublets from graphene monolayers JS Kim, JH Warner, AW Robertson, AI Kirkland ACS nano 9 (9), 8916-8922, 2015 | 11 | 2015 |
| Optimized conditions for imaging the effects of bonding charge density in electron microscopy J Ciston, JS Kim, SJ Haigh, AI Kirkland, LD Marks Ultramicroscopy 111 (7), 901-911, 2011 | 9 | 2011 |
