| Exploiting Active Learning for Microcontroller Performance Prediction N Bellarmino, R Cantoro, M Huch, T Kilian, R Martone, U Schlichtmann, ... 2021 IEEE European Test Symposium (ETS), 1-4, 2021 | 11 | 2021 |
| Test, reliability and functional safety trends for automotive system-on-chip F Angione, D Appello, J Aribido, J Athavale, N Bellarmino, P Bernardi, ... 2022 IEEE European Test Symposium (ETS), 1-10, 2022 | 10 | 2022 |
| Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data N Bellarmino, R Cantoro, M Huch, T Kilian, U Schlichtmann, G Squillero 2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022 | 9 | 2022 |
| A Multilabel Active Learning Framework for Microcontroller Performance Screening N Bellarmino, R Cantoro, M Huch, T Kilian, R Martone, U Schlichtmann, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2023 | 5 | 2023 |
| Semi-Supervised Deep Learning for Microcontroller Performance Screening N Bellarmino, R Cantoro, M Huch, T Kilian, U Schlichtmann, G Squillero 2023 IEEE European Test Symposium (ETS), 1-6, 2023 | 4 | 2023 |
| Feature Selection for Cost Reduction In MCU Performance Screening N Bellarmino, R Cantoro, M Huch, T Kilian, U Schlichtmann, G Squillero 2023 IEEE 24th Latin American Test Symposium (LATS), 1-6, 2023 | 4 | 2023 |
| COVID-19 detection from exhaled breath N Bellarmino, R Cantoro, M Castelluzzo, R Correale, G Squillero, ... Scientific Reports 14 (1), 23245, 2024 | 3 | 2024 |
| Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening N Bellarmino, R Cantoro, M Huch, T Kilian, U Schlichtmann, G Squillero IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2024 | 1 | 2024 |
| Enabling Inter-Product Transfer Learning on MCU Performance Screening N Bellarmino, R Cantoro, M Huch, T Kilian, U Schlichtmann, G Squillero 2023 IEEE 32nd Asian Test Symposium (ATS), 1-6, 2023 | 1 | 2023 |
| Device-Aware Test for Anomalous Charge Trapping in FeFETs S Yuan, C Wang, M Fieback, H Xun, M Taouil, X Li, D Chen, L Wang, ... Proceedings of the 30th Asia and South Pacific Design Automation Conference …, 2025 | | 2025 |
| Computational Intelligence for Computer-Aided Design Machine Learning Techniques for Microcontrollers Performance Screenings N Bellarmino Politecnico di Torino, 2024 | | 2024 |
| COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening N Bellarmino, R Cantoro, SM Fosson, M Huch, T Kilian, U Schlichtmann, ... IEEE Transactions on Computers, 2024 | | 2024 |
| Embedded Feature Selection in MCU Performance Screening N Bellarmino, R Cantoro, M Huch, T Kilian, U Schlichtmann, G Squillero 2024 IEEE International Conference on Design, Test and Technology of …, 2024 | | 2024 |
| Investigating on Gradient Regularization for Testing Neural Networks N Bellarmino, A Bosio, R Cantoro, A Ruospo, E Sanchez, G Squillero International Conference on Machine Learning, Optimization, and Data Science …, 2024 | | 2024 |
| U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration N Bellarmino, R Cantoro, G Squillero International Conference on Machine Learning, Optimization, and Data Science …, 2023 | | 2023 |
| Transfer Learning in MCU Performance Screening N Bellarmino, R Cantoro, M Huch, T Kilian, U Schlichtmann, G Squillero IEEE International Test Conference (ITC), 2023 | | 2023 |
| COVID-19 Detection from Mass Spectra of Exhaled Breath. N Bellarmino, G Bozzini, R Cantoro, F Castelletti, M Castelluzzo, ... CoRR, 2023 | | 2023 |
| Machine Learning for Microcontroller Performance Screening N Bellarmino 2023 IEEE European Test Symposium, 2023 | | 2023 |
| SP2-Test, Reliability and Functional Safety Trends for Automotive System-on-Chip F Angione, D Appello, J Aribido, J Athavale, N Bellarmino, P Bernardi, ... | | 2022 |
| Computational intelligence techniques for device testing N Bellarmino Politecnico di Torino, 2021 | | 2021 |
Riccardo CantoroDepartment of Control and Computer Engineering, Politecnico di TorinoVerified email at polito.it
