Marek Turowski
Marek Turowski
Alphacore Inc., USA
Verified email at ieee.org
Title
Cited by
Cited by
Year
Compact damping models for laterally moving microstructures with gas-rarefaction effects
T Veijola, M Turowski
Journal of Microelectromechanical Systems 10 (2), 263-273, 2001
1632001
Nonuniform total-dose-induced charge distribution in shallow-trench isolation oxides
M Turowski, A Raman, RD Schrimpf
IEEE transactions on nuclear science 51 (6), 3166-3171, 2004
1492004
Intermediate-band solar cells based on quantum dot supracrystals
Q Shao, AA Balandin, AI Fedoseyev, M Turowski
Applied Physics Letters 91 (16), 163503, 2007
1302007
Method of three-dimensional network solution of leakage field of three-phase transformers
J Turowski, M Turowski, M Kopec
IEEE Transactions on Magnetics 26 (5), 2911-2919, 1990
901990
Fast, automated thermal simulation of three-dimensional integrated circuits
P Wilkerson, A Raman, M Turowski
The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena …, 2004
712004
An evaluation of transistor-layout RHBD techniques for SEE mitigation in SiGe HBTs
AK Sutton, M Bellini, JD Cressler, JA Pellish, RA Reed, PW Marshall, ...
IEEE Transactions on Nuclear Science 54 (6), 2044-2052, 2007
612007
Mixed-mode simulation and analysis of digital single event transients in fast CMOSICs
M Turowski, A Raman, G Jablonski
2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007
512007
Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs
JA Pellish, RA Reed, D McMorrow, G Vizkelethy, VF Cavrois, J Baggio, ...
IEEE Transactions on Nuclear Science 56 (6), 3078-3084, 2009
412009
Compact thermal modeling analysis for 3D integrated circuits
P Wilkerson, M Furmanczyk, M Turowski
11th International Conference Mixed Design of Integrated Circuits and …, 2004
362004
Engineering electrodynamics: electric machine, transformer, and power equipment design
J Turowski, M Turowski
Crc Press, 2017
332017
Single event transient response of SiGe voltage references and its impact on the performance of analog and mixed-signal circuits
L Najafizadeh, SD Phillips, KA Moen, RM Diestelhorst, M Bellini, PK Saha, ...
IEEE Transactions on Nuclear Science 56 (6), 3469-3476, 2009
312009
Multiphysics design and simulation environment for microelectromechanical systems
AJ Przekwas, M Turowski, M Furmanczyk, A Hieke, RJ Pryputniewicz
Proc. Internat. Symp. on MEMS: Mechanics and Measurements, 84-89, 2001
292001
CFD-Micromesh: A fast geometric modeling and mesh generation tool for 3D microsystem simulations
Z Tan, M Furmanczyk, M Turowski, AJ Przekwas
Design, Test, Integration, and Packaging of MEMS/MOEMS 4019, 193-199, 2000
292000
Temperature-dependence of off-state drain leakage in X-ray irradiated 130 nm CMOS devices
B Jun, RM Diestelhorst, M Bellini, G Espinel, A Appaswamy, APG Prakash, ...
IEEE transactions on nuclear science 53 (6), 3203-3209, 2006
282006
Reconciling 3-D mixed-mode simulations and measured single-event transients in SiGe HBTs
M Turowski, JA Pellish, KA Moen, A Raman, JD Cressler, RA Reed, G Niu
IEEE Transactions on Nuclear Science 57 (6), 3342-3348, 2010
232010
A MEMS shield structure for controlling pull-in forces and obtaining increased pull-in voltages
H Busta, R Amantea, D Furst, JM Chen, M Turowski, C Mueller
Journal of Micromechanics and Microengineering 11 (6), 720, 2001
222001
An investigation of single-event effects and potential SEU mitigation strategies in fourth-generation, 90 nm SiGe BiCMOS
NE Lourenco, SD Phillips, TD England, AS Cardoso, ZE Fleetwood, ...
IEEE Transactions on Nuclear Science 60 (6), 4175-4183, 2013
212013
Efficient modeling of single event transients directly in compact device models
AM Francis, M Turowski, JA Holmes, HA Mantooth
2007 IEEE International Behavioral Modeling and Simulation Workshop, 73-77, 2007
182007
Automated generation of compact models for fluidic microsystems
M Turowski, Z Chen, A Przekwas
Analog Integrated Circuits and Signal Processing 29 (1-2), 27-36, 2001
182001
Simulating the radiation response of GaAs solar cells using a defect-based TCAD model
M Turowski, T Bald, A Raman, A Fedoseyev, JH Warner, CD Cress, ...
IEEE Transactions on Nuclear Science 60 (4), 2477-2485, 2013
172013
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