Ron Schrimpf
Ron Schrimpf
Professor of Electrical Engineering, Vanderbilt University
Verified email at vanderbilt.edu
Title
Cited by
Cited by
Year
Charge collection and charge sharing in a 130 nm CMOS technology
OA Amusan, AF Witulski, LW Massengill, BL Bhuva, PR Fleming, ML Alles, ...
IEEE Transactions on nuclear science 53 (6), 3253-3258, 2006
3912006
Response of advanced bipolar processes to ionizing radiation
EW Enlow, RL Pease, W Combs, RD Schrimpf, RN Nowlin
IEEE transactions on nuclear science 38 (6), 1342-1351, 1991
3721991
Physical mechanisms contributing to enhanced bipolar gain degradation at low dose rates
DM Fleetwood, SL Kosier, RN Nowlin, RD Schrimpf, RA Reber, M DeLaus, ...
IEEE Transactions on Nuclear Science 41 (6), 1871-1883, 1994
3411994
Physical model for enhanced interface-trap formation at low dose rates
SN Rashkeev, CR Cirba, DM Fleetwood, RD Schrimpf, SC Witczak, ...
IEEE Transactions on Nuclear Science 49 (6), 2650-2655, 2002
2582002
Monte Carlo simulation of single event effects
RA Weller, MH Mendenhall, RA Reed, RD Schrimpf, KM Warren, ...
IEEE Transactions on Nuclear Science 57 (4), 1726-1746, 2010
2242010
Charge separation for bipolar transistors
SL Kosier, RD Schrimpf, RN Nowlin, DM Fleetwood, M DeLaus, RL Pease, ...
IEEE Transactions on Nuclear Science 40 (6), 1276-1285, 1993
2081993
ELDRS in bipolar linear circuits: A review
RL Pease, RD Schrimpf, DM Fleetwood
2008 European Conference on Radiation and Its Effects on Components and …, 2008
1982008
Defect generation by hydrogen at the Si-SiO2 interface
SN Rashkeev, DM Fleetwood, RD Schrimpf, ST Pantelides
Physical review letters 87 (16), 165506, 2001
1942001
Characterization of digital single event transient pulse-widths in 130-nm and 90-nm CMOS technologies
B Narasimham, BL Bhuva, RD Schrimpf, LW Massengill, MJ Gadlage, ...
IEEE Transactions on Nuclear Science 54 (6), 2506-2511, 2007
1902007
Structure, Properties, and Dynamics of Oxygen Vacancies in Amorphous SiO2
ZY Lu, CJ Nicklaw, DM Fleetwood, RD Schrimpf, ST Pantelides
Physical review letters 89 (28), 285505, 2002
1872002
Single event transient pulse widths in digital microcircuits
MJ Gadlage, RD Schrimpf, JM Benedetto, PH Eaton, DG Mavis, M Sibley, ...
IEEE transactions on nuclear science 51 (6), 3285-3290, 2004
1862004
Radiation effects at low electric fields in thermal, SIMOX, and bipolar-base oxides
DM Fleetwood, LC Riewe, JR Schwank, SC Witczak, RD Schrimpf
IEEE Transactions on Nuclear Science 43 (6), 2537-2546, 1996
1791996
Trends in the total-dose response of modern bipolar transistors
RN Nowlin, EW Enlow, RD Schrimpf, WE Combs
IEEE transactions on nuclear science 39 (6), 2026-2035, 1992
1771992
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
KM Warren, RA Weller, MH Mendenhall, RA Reed, DR Ball, CL Howe, ...
IEEE transactions on nuclear science 52 (6), 2125-2131, 2005
1762005
Impact of low-energy proton induced upsets on test methods and rate predictions
BD Sierawski, JA Pellish, RA Reed, RD Schrimpf, KM Warren, RA Weller, ...
IEEE Transactions on Nuclear Science 56 (6), 3085-3092, 2009
1752009
Unified model of hole trapping, 1/f noise, and thermally stimulated current in MOS devices
DM Fleetwood, HD Xiong, ZY Lu, CJ Nicklaw, JA Felix, RD Schrimpf, ...
IEEE Transactions on Nuclear Science 49 (6), 2674-2683, 2002
1662002
Reactions of hydrogen with Si-SiO2 interfaces
ST Pantelides, SN Rashkeev, R Buczko, DM Fleetwood, RD Schrimpf
IEEE Transactions on Nuclear Science 47 (6), 2262-2268, 2000
1592000
Proton-irradiation effects on AlGaN/AlN/GaN high electron mobility transistors
X Hu, AP Karmarkar, B Jun, DM Fleetwood, RD Schrimpf, RD Geil, ...
IEEE Transactions on Nuclear Science 50 (6), 1791-1796, 2003
1572003
Analysis of single-event transients in analog circuits
P Adell, RD Schrimpf, HJ Barnaby, R Marec, C Chatry, P Calvel, C Barillot, ...
IEEE Transactions on Nuclear Science 47 (6), 2616-2623, 2000
1562000
Hardness assurance testing of bipolar junction transistors at elevated irradiation temperatures
SC Witczak, RD Schrimpf, DM Fleetwood, KF Galloway, RC Lacoe, ...
IEEE Transactions on Nuclear Science 44 (6), 1989-2000, 1997
1551997
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