Reliable algorithm for iris segmentation in eye image W Sankowski, K Grabowski, M Napieralska, M Zubert, A Napieralski Image and vision computing 28 (2), 231-237, 2010 | 102 | 2010 |
A reliable iris recognition algorithm based on reverse biorthogonal wavelet transform R Szewczyk, K Grabowski, M Napieralska, W Sankowski, M Zubert, ... Pattern Recognition Letters 33 (8), 1019-1026, 2012 | 93 | 2012 |
Behavioral approach to SiC MPS diode electrothermal model generation Ł Starzak, M Zubert, M Janicki, T Torzewicz, M Napieralska, G Jablonski, ... IEEE Transactions on Electron Devices 60 (2), 630-638, 2012 | 40 | 2012 |
Advanced modeling techniques for dynamic feeder rating systems GJ Anders, A Napieralski, SM Zubert, M Orlikowski Conference Record of the 2002 IEEE Industry Applications Conference. 37th …, 2002 | 34 | 2002 |
Reliable iris localization method with application to iris recognition in near infrared light K Grabowski, W Sankowski, M Zubert, M Napieralska Proceedings of the International Conference Mixed Design of Integrated …, 2006 | 33 | 2006 |
Theoretical and experimental study of heat conduction in as-prepared and oxidized meso-porous silicon V Lysenko, L Boarino, M Bertola, B Remaki, A Dittmar, G Amato, D Barbier Microelectronics journal 30 (11), 1141-1147, 1999 | 29 | 1999 |
Application of inverse problem algorithms for integrated circuit temperature estimation M Janicki, M Zubert, A Napieralski Microelectronics journal 30 (11), 1099-1107, 1999 | 27 | 1999 |
Iris recognition algorithm optimized for hardware implementation K Grabowski, W Sankowski, M Napieralska, M Zubert, A Napieralski 2006 IEEE Symposium on Computational Intelligence and Bioinformatics and …, 2006 | 25 | 2006 |
The Heat Transport in Nanoelectronic Devices and PDEs Translation into Hardware Description Languages M Zubert, M Janicki, T Raszkowski, A Samson, PS Nowak, K Pomorski Bulletin de la Société des Sciences et des Lettres de Lódz, Série …, 2014 | 22 | 2014 |
Application of inverse heat conduction methods in temperature monitoring of integrated circuits M Janicki, M Zubert, A Napieralski Sensors and actuators A: physical 71 (1-2), 51-57, 1998 | 21 | 1998 |
Iris Finder-program for reliable iris localisation in images taken under visible light W Sankowski, K Grabowski, M Zubert, M Napieralska Journal of Medical Informatics & Technologies 10, 125--132, 2006 | 18 | 2006 |
The distributed thermal model of fin field effect transistor M Zubert, T Raszkowski, A Samson, M Janicki, A Napieralski Microelectronics Reliability 67, 9-14, 2016 | 17 | 2016 |
Numerical solution of 1-D DPL heat transfer equation T Raszkowski, M Zubert, M Janicki, A Napieralski 2015 22nd International Conference Mixed Design of Integrated Circuits …, 2015 | 16 | 2015 |
Eyelids localization method designed for iris recognition system W Sankowski, K Grabowski, M Napieralska, M Zubert 2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007 | 16 | 2007 |
rescuer—the new solution in multidomain simulations M Zubert, M Napieralska, A Napieralski Microelectronics journal 31 (11-12), 945-954, 2000 | 16 | 2000 |
Comparison of Green׳ s function solutions for different heat conduction models in electronic nanostructures M Janicki, A Samson, T Raszkowski, M Zubert, A Napieralski Microelectronics Journal 46 (12), 1162-1166, 2015 | 15 | 2015 |
Focus assessment issues in iris image acquisition system K Grabowski, W Sankowski, M Zubert, M Napieralska 2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007 | 14 | 2007 |
Physical power diode model and its implementation in SABER environment L Starzak, M Zubert, A Napieralski, P Austin, G Bonnet, T Bordignon, ... Proc. 8th Int. Conf. Mix. Des. Integr. Circ. Syst. MIXDES, 213-220, 2001 | 12 | 2001 |
Improvement of an electro-thermal model of SiC MPS diodes Ł Starzak, A Stefanskyi, M Zubert, A Napieralski IET Power Electronics 11 (4), 660-667, 2018 | 11 | 2018 |
The new general method for thermal and electro-thermal model reduction M Zubert, A Napieralski, M Napieralska 6th international workshop on THERmal INvestigations of ICs and Systems …, 2000 | 11 | 2000 |