| Constant-voltage-bias stress testing of a-IGZO thin-film transistors K Hoshino, D Hong, HQ Chiang, JF Wager IEEE Transactions on Electron Devices 56 (7), 1365-1370, 2009 | 224 | 2009 |
| Low-Energy Path to Dense HfO2 Thin Films with Aqueous Precursor K Jiang, JT Anderson, K Hoshino, D Li, JF Wager, DA Keszler Chemistry of Materials 23 (4), 945-952, 2011 | 111 | 2011 |
| Impact of humidity on the electrical performance of amorphous oxide semiconductor thin‐film transistors K Hoshino, B Yeh, JF Wager Journal of the Society for Information Display 21 (7), 310-316, 2013 | 32 | 2013 |
| Operating temperature trends in amorphous In–Ga–Zn–O thin-film transistors K Hoshino, JF Wager IEEE Electron Device Letters 31 (8), 818-820, 2010 | 32 | 2010 |
| Passivation of amorphous oxide semiconductors utilizing a zinc–tin–silicon–oxide barrier layer ES Sundholm, RE Presley, K Hoshino, CC Knutson, RL Hoffman, ... IEEE electron device letters 33 (6), 836-838, 2012 | 31 | 2012 |
| Zirconium oxide-aluminum oxide nanolaminate gate dielectrics for amorphous oxide semiconductor thin-film transistors T Waggoner, J Triska, K Hoshino, JF Wager, JF Conley Journal of Vacuum Science & Technology B 29 (4), 2011 | 19 | 2011 |
| A framework for assessing amorphous oxide semiconductor thin‐film transistor passivation JF Wager, K Hoshino, ES Sundholm, RE Presley, R Ravichandran, ... Journal of the Society for Information Display 20 (10), 589-595, 2012 | 13 | 2012 |
| Fabrication Process Assessment and Negative Bias Illumination Stress Study of Indium-Gallium-Zinc Oxide and Zinc-Tin Oxide Thin-Film Transistors K Hoshino Oregon State University, 2012 | 6 | 2012 |
| Instability and temperature-dependence assessment of IGZO TFTs K Hoshino | 4 | 2008 |
| Negative bias illumination stress assessment of indium gallium zinc oxide thin‐film transistors K Hoshino, J Wager Journal of the Society for Information Display 23 (5), 187-195, 2015 | 2 | 2015 |
| Stability of IGZO-Based Thin-Film Transistor: Stability and Temperature-Dependence Assessment of IGZO TFTs K Hoshino, J Wager LAP LAMBERT Academic Publishing, 2010 | 2 | 2010 |
| Carrier profiling of the 10-nm-order structure in a 3D Flash memory cell using scanning non-linear dielectric microscopy YC J. Hirota, K. Hoshino, T. Nakai, K. Yamasue ISTFA 2019, 490-492, 2019 | 1 | 2019 |
| Semiconductor memory device and method for manufacturing semiconductor memory device K Noda, N Kyoko, K Hoshino, S Tsubata US Patent 11,581,485, 2023 | | 2023 |
| Semiconductor storage device K Hoshino US Patent App. 17/462,302, 2022 | | 2022 |
| Carrier profile mapping in a 3D Flash memory cell using scanning nonlinear dielectric microscopy J Hirota, K Hoshino, K Yamasue, Y Cho 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM …, 2022 | | 2022 |
John F. WagerProfessor Emeritus, EECS, Oregon State UniversityVerified email at ece.orst.edu
John F. WagerProfessor Emeritus, EECS, Oregon State UniversityVerified email at ece.orst.edu