| Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology LH Brendler, AL Zimpeck, C Meinhardt, R Reis IEEE Transactions on Circuits and Systems I: Regular Papers 67 (2), 553-564, 2019 | 10 | 2019 |
| Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells LH Brendler, AL Zimpeck, C Meinhardt, R Reis 2018 25th IEEE International Conference on Electronics, Circuits and Systems …, 2018 | 10 | 2018 |
| Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements LH Brendler, AL Zimpeck, C Meinhardt, R Reis 2018 IFIP/IEEE International Conference on Very Large Scale Integration …, 2018 | 8 | 2018 |
| Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters LH Brendler, AL Zimpeck, C Meinhardt, R Reis 2020 IEEE Latin-American Test Symposium (LATS), 1-6, 2020 | 5 | 2020 |
| Circuit Level Design Methods to Mitigate Soft Errors R Reis, C Meinhardt, AL Zimpeck, LH Brendler, L Moraes 2020 IEEE Latin-American Test Symposium (LATS), 1-3, 2020 | 5 | 2020 |
| Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit LH Brendler, AL Zimpeck, FL Kastensmidt, C Meinhardt, R Reis 2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS), 1-4, 2021 | 4 | 2021 |
| Gate mapping impact on variability robustness in FinFET technology LH Brendler, AL Zimpeck, C Meinhardt, RAL Reis Microelectronics Reliability 100, 113448, 2019 | 4 | 2019 |
| An sram-based multiple event upsets detection method for space applications LH Brendler, H Lapuyade, Y Deval, R Reis, F Rivet 2022 22nd European Conference on Radiation and Its Effects on Components and …, 2022 | 3 | 2022 |
| Evaluation of SET under Process Variability on FinFET Multi-level Design LH Brendler, AL Zimpeck, C Meinhardt, R Reis 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration …, 2019 | 3 | 2019 |
| Impact of Process Variability and Single Event Transient on FinFET Technology LH Brendler, AL Zimpeck, C Meinhardt, R Reis 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration …, 2019 | 2 | 2019 |
| A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications LH Brendler, H Lapuyade, Y Deval, F Darracq, F Fauquet, R Reis, F Rivet IEEE Transactions on Circuits and Systems I: Regular Papers, 2023 | 1 | 2023 |
| Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study BB Sandoval, LH Brendler, AL Zimpeck, FL Kastensmidt, R Reis, ... 2021 IEEE 22nd Latin American Test Symposium (LATS), 1-6, 2021 | 1 | 2021 |
| Process variability impact on the set response of finfet multi-level design LH Brendler, AL Zimpeck, C Meinhardt, R Reis VLSI-SoC: New Technology Enabler: 27th IFIP WG 10.5/IEEE International …, 2020 | 1 | 2020 |
| Projeto de Portas Lógicas XOR com Redução de Potência por Voltage Scaling LH Brendler, C Farias, AL Zimpeck, Y Aguiar, C Meinhardt, R Reis Iberchip Workshop, 2017 | 1 | 2017 |
| Comparative Implementation of PicoSoC System-on-Chip in X-Fab 180 nm CMOS Technology R Wuerdig, LH Brendler, C Diniz, R Reis, S Bampi Journal of Integrated Circuits and Systems 19 (1), 1-7, 2024 | | 2024 |
| Memory circuit hardening to Multiple-Cell Upsets LH Brendler Université de Bordeaux; Universidade Federal do Rio Grande do Sul (Porto …, 2023 | | 2023 |
| A Tool for Automatic Radiation-Hardened SRAM Layout Generation LH Brendler, H Lapuyade, Y Deval, R Reis, F Rivet 2023 30th IEEE International Conference on Electronics, Circuits and Systems …, 2023 | | 2023 |
| A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures CM Marques, LH Brendler, F Wrobel, AL Zimpeck, WEC Bartra, PF Butzen, ... 2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems …, 2023 | | 2023 |
| A MCU-robust Interleaved Data/Detection SRAM for Space Environments LH Brendler, H Lapuyade, Y Deval, R Reis, F Rivet 2023 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 1-6, 2023 | | 2023 |
| Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation BB Sandoval, LH Brendler, FL Kastensmidt, R Reis, AL Zimpeck, ... 2023 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2023 | | 2023 |
Ricardo Augusto da Luz ReisUFRGSVerified email at inf.ufrgs.br
