| Electronic properties of materials RE Hummel Springer Science & Business Media, 2011 | 1333 | 2011 |
| Understanding materials science: history, properties, applications RE Hummel Springer, 1998 | 289 | 1998 |
| Novel technique for preparing porous silicon RE Hummel, SS Chang Applied physics letters 61 (16), 1965-1967, 1992 | 213 | 1992 |
| Activation energy for electrotransport in thin silver and gold films RE Hummel, HJ Geier Thin Solid Films 25 (2), 335-342, 1975 | 123 | 1975 |
| Optische Eigenschaften von Metallen und Legierungen RE Hummel Springer, 1971 | 109 | 1971 |
| Activation energy for electrotransport in thin aluminum films by resistance measurements RE Hummel, RT Dehoff, HJ Geier Journal of Physics and Chemistry of Solids 37 (1), 73-80, 1976 | 98 | 1976 |
| The passivation of nickel in aqueous solutions—I. The identification of insoluble corrosion products on nickel electrodes using optical and ESCA techniques RE Hummel, RJ Smith, ED Verink Jr Corrosion science 27 (8), 803-813, 1987 | 87 | 1987 |
| Electromigration and related failure mechanisms in integrated circuit interconnects RE Hummel International materials reviews 39 (3), 97-112, 1994 | 81 | 1994 |
| Electro- and Thermo-Transport in Metals and Alloys RE Hummel, HB Huntington AIME, New York. 1977, 159 p, 1977 | 79* | 1977 |
| On the origin of photoluminescence in spark‐eroded (porous) silicon RE Hummel, A Morrone, M Ludwig, SS Chang Applied physics letters 63 (20), 2771-2773, 1993 | 76 | 1993 |
| Handbook of optical properties: thin films for optical coatings RE Hummel, KH Guenther Crc Press, 1995 | 75 | 1995 |
| Differential reflectometry and its application to the study of alloys, ordering, corrosion, and surface properties RE Hummel physica status solidi (a) 76 (1), 11-44, 1983 | 73 | 1983 |
| Electromigration in thin silver, copper, gold, indium, tin, lead and magnesium films HM Breitling, RE Hummel Journal of Physics and Chemistry of Solids 33 (4), 845-852, 1972 | 73 | 1972 |
| Microfabrication of ceramics by filling of photoresist molds UP Schönholzer, R Hummel, LJ Gauckler Advanced Materials 12 (17), 1261-1263, 2000 | 70 | 2000 |
| Bright visible photoluminescence of spark‐processed Ge, GaAs, and Si MH Ludwig, RE Hummel, SS Chang Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1994 | 69 | 1994 |
| Thermal grooving, thermotransport and electrotransport in doped and undoped thin gold films RE Hummel, RT DeHoff, S Matts-Goho, WM Goho Thin Solid Films 78 (1), 1-14, 1981 | 68 | 1981 |
| On the direction of electromigration in thin silver, gold, and copper films RE Hummel, RM Breitling Applied Physics Letters 18 (9), 373-375, 1971 | 61 | 1971 |
| Simultaneous micro-Raman and photoluminescence study of spark-processed germanium: Report on the origin of the orange photoluminescence emission band G Kartopu, SC Bayliss, RE Hummel, Y Ekinci Journal of applied physics 95 (7), 3466-3472, 2004 | 58 | 2004 |
| Electromigration in integrated circuits DW Malone, RE Hummel Critical Reviews in Solid State and Material Sciences 22 (3), 199-238, 1997 | 58 | 1997 |
| The passivation of nickel in aqueous solutions—II. An in situ investigation of the passivation of nickel using optical and electrochemical techniques RJ Smith, RE Hummel, JR Ambrose Corrosion science 27 (8), 815-826, 1987 | 57 | 1987 |
