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M. I. Abd-Elrahman
M. I. Abd-Elrahman
Professor, Department of Physics , Faculty of Science, Assiut University
Verified email at aun.edu.eg - Homepage
Title
Cited by
Cited by
Year
Photoluminescence and decay kinetics of indirect free excitons in diamonds under the near-resonant laser excitation
K Takiyama, MI Abd-Elrahman, T Fujita, T Oda
Solid state communications 99 (11), 793-797, 1996
761996
Effect of Sn additive on the structure and crystallization kinetics in Ge–Se alloy
MI Abd-Elrahman, MM Hafiz, AM Abdelraheem, AA Abu-Sehly
Journal of Alloys and Compounds 675, 1-7, 2016
322016
Thermal degradation kinetics and geometrical stability of D-sucrose
MI Abd-Elrahman, SM Ahmed
International Journal of Polymeric Materials 58 (6), 322-335, 2009
292009
Thermal annealing effect on the optical properties of Ag10As30S60 thin film
MI Abd-Elrahman, AY Abdel-Latief, RM Khafagy, N Younis, MM Hafiz
Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy 137, 29-32, 2015
262015
On thickness and annealing dependence of optical properties of Te67. 5 Ga2. 5 As30 thin film as optoelectronic material
MI Abd-Elrahman, MM Hafiz
Journal of alloys and compounds 551, 562-567, 2013
242013
Kinetics of solid state stability of glycine derivatives as a model for peptides using differential scanning calorimetry
MI Abd-Elrahman, MO Ahmed, SM Ahmed, A El-Shorbagi
Biophysical chemistry 97 (2-3), 113-120, 2002
222002
Effect of annealing temperature on the optical and electrical properties of amorphous As45. 2Te46. 6In8. 2 thin films
AA Abu-Sehly, MI Abd-Elrahman
Journal of Physics and Chemistry of Solids 63 (1), 163-170, 2002
192002
Characterization of optical constants of Se30Te70 thin film: Effect of the thickness
MI Abd-Elrahman, RM Khafagy, SA Zaki, MM Hafiz
Materials science in semiconductor processing 18, 1-5, 2014
182014
Infrared investigations of Cu-Zn ferrite substituted with rare earth ions
MH Mahmoud, MI Abd-Elrahman
Materials letters 73, 226-228, 2012
182012
Effect of the film thickness on the optical constants and dispersion parameters of chalcogenide Ge20Se70Ag10 thin film
MI Abd-Elrahman, AY Abdel-Latief, RM Khafagy, N Younis, MM Hafiz
Materials science in semiconductor processing 24, 21-25, 2014
172014
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