Follow
Luis Entrena
Title
Cited by
Cited by
Year
Autonomous fault emulation: A new FPGA-based acceleration system for hardness evaluation
C Lopez-Ongil, M Garcia-Valderas, M Portela-Garcia, L Entrena
IEEE Transactions on Nuclear Science 54 (1), 252-261, 2007
1682007
Combinational and sequential logic optimization by redundancy addition and removal
LA Entrena, KT Cheng
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1995
1521995
Soft error sensitivity evaluation of microprocessors by multilevel emulation-based fault injection
L Entrena, M Garcia-Valderas, R Fernandez-Cardenal, A Lindoso, ...
IEEE Transactions on Computers 61 (3), 313-322, 2010
1462010
Multi-level logic optimization by redundancy addition and removal
KT Cheng, LA Entrena
1993 European Conference on Design Automation with the European Event in …, 1993
1301993
New techniques for speeding-up fault-injection campaigns
L Berrojo, I González, F Corno, MS Reorda, G Squillero, L Entrena, ...
Proceedings 2002 Design, Automation and Test in Europe Conference and …, 2002
1212002
Sequential logic optimization by redundancy addition and removal
L Entrena, KT Cheng
Proceedings of 1993 International Conference on Computer Aided Design (ICCAD …, 1993
1211993
Using benchmarks for radiation testing of microprocessors and FPGAs
H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ...
IEEE transactions on nuclear science 62 (6), 2547-2554, 2015
1152015
Partial TMR in FPGAs using approximate logic circuits
AJ Sánchez-Clemente, L Entrena, M García-Valderas
IEEE Transactions on Nuclear Science 63 (4), 2233-2240, 2016
612016
AKARI-X: A pseudo random number generator for secure lightweight systems
H Martin, E San Millan, L Entrena, PPC Lopez
IOLTS, 13-15, 2011
58*2011
Analyzing the impact of single-event-induced charge sharing in complex circuits
S Pagliarini, F Kastensmidt, L Entrena, A Lindoso, E San Millan
IEEE Transactions on Nuclear Science 58 (6), 2768-2775, 2011
542011
Fault injection in modern microprocessors using on-chip debugging infrastructures
M Portela-Garcia, C Lopez-Ongil, MGG Valderas, L Entrena
IEEE Transactions on Dependable and Secure Computing 8 (2), 308-314, 2010
512010
A unified environment for fault injection at any design level based on emulation
C Lopez-Ongil, L Entrena, M Garcia-Valderas, M Portela, MA Aguirre, ...
IEEE Transactions on Nuclear Science 54 (4), 946-950, 2007
492007
An industrial environment for high-level fault-tolerant structures insertion and validation
L Berrojo, F Corno, L Entrena, I Gonzalez, C López, MS Reorda, ...
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 229-236, 2002
482002
A hybrid fault-tolerant LEON3 soft core processor implemented in low-end SRAM FPGA
A Lindoso, L Entrena, M García-Valderas, L Parra
IEEE Transactions on Nuclear Science 64 (1), 374-381, 2016
452016
High performance FPGA-based image correlation
A Lindoso, L Entrena
Journal of Real-Time Image Processing 2, 223-233, 2007
452007
Correlation-based fingerprint matching with orientation field alignment
A Lindoso, L Entrena, J Liu-Jimenez, E San Millan
Advances in Biometrics: International Conference, ICB 2007, Seoul, Korea …, 2007
452007
SET emulation considering electrical masking effects
L Entrena, MG Valderas, RF Cardenal, MP Garcia, CL Ongil
IEEE Transactions on Nuclear Science 56 (4), 2021-2025, 2009
442009
Error mitigation using approximate logic circuits: A comparison of probabilistic and evolutionary approaches
AJ Sanchez-Clemente, L Entrena, R Hrbacek, L Sekanina
IEEE Transactions on Reliability 65 (4), 1871-1883, 2016
432016
Logic masking for SET mitigation using approximate logic circuits
A Sanchez-Clemente, L Entrena, M García-Valderas, C López-Ongil
2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 176-181, 2012
422012
Constrained placement methodology for reducing SER under single-event-induced charge sharing effects
L Entrena, A Lindoso, E San Millan, S Pagliarini, F Almeida, ...
IEEE Transactions on Nuclear Science 59 (4), 811-817, 2012
412012
The system can't perform the operation now. Try again later.
Articles 1–20