متابعة
Jean-Pierre Raskin
Jean-Pierre Raskin
Université catholique de Louvain, Engineering School of Louvain
بريد إلكتروني تم التحقق منه على uclouvain.be
عنوان
عدد مرات الاقتباسات
عدد مرات الاقتباسات
السنة
Substrate crosstalk reduction using SOI technology‏
JP Raskin, A Viviani, D Flandre, JP Colinge‏
IEEE Transactions on electron devices 44 (12), 2252-2261, 1997‏
4071997
New substrate passivation method dedicated to HR SOI wafer fabrication with increased substrate resistivity‏
D Lederer, JP Raskin‏
IEEE Electron Device Letters 26 (11), 805-807, 2005‏
2922005
Low temperature implementation of dopant-segregated band-edge metallic S/D junctions in thin-body SOI p-MOSFETs‏
G Larrieu, E Dubois, R Valentin, N Breil, F Danneville, G Dambrine, ...‏
2007 IEEE International Electron Devices Meeting, 147-150, 2007‏
2822007
Arsenic-segregated rare-earth silicide junctions: reduction of Schottky barrier and integration in metallic n-MOSFETs on SOI‏
G Larrieu, DA Yarekha, E Dubois, N Breil, O Faynot‏
IEEE Electron Device Letters 30 (12), 1266-1268, 2009‏
2702009
Raman and XPS characterization of vanadium oxide thin films with temperature‏
F Ureña-Begara, A Crunteanu, JP Raskin‏
Applied Surface Science 403, 717-727, 2017‏
2692017
Influence of device engineering on the analog and RF performances of SOI MOSFETs‏
V Kilchytska, A Neve, L Vancaillie, D Levacq, S Adriaensen, H van Meer, ...‏
IEEE Transactions on Electron Devices 50 (3), 577-588, 2003‏
2672003
Fabrication method of so1 semiconductor devices‏
D Fladre, A De Mevergnies, JP Raskins‏
US Patent App. 10/471,847, 2004‏
2562004
Identification of RF harmonic distortion on Si substrates and its reduction using a trap-rich layer‏
DC Kerr, JM Gering, TG McKay, MS Carroll, CR Neve, JP Raskin‏
2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF …, 2008‏
1842008
Fully-depleted SOI CMOS for analog applications‏
JP Colinge‏
IEEE Transactions on Electron Devices 45 (5), 1010-1016, 1998‏
1751998
A 94-GHz aperture-coupled micromachined microstrip antenna‏
GP Gauthier, JP Raskin, LPB Katehi, GM Rebeiz‏
IEEE Transactions on Antennas and Propagation 47 (12), 1761-1766, 1999‏
1691999
Semiconductor-on-insulator materials for nanoelectronics applications‏
A Nazarov, JP Colinge, F Balestra, JP Raskin, F Gamiz, VS Lysenko‏
Springer Berlin Heidelberg, 2011‏
1682011
Substrate loss mechanisms for microstrip and CPW transmission lines on lossy silicon wafers‏
D Lederer, JP Raskin‏
Solid-State Electronics 47 (11), 1927-1936, 2003‏
1642003
Low-temperature wafer bonding: a study of void formation and influence on bonding strength‏
XX Zhang, JP Raskin‏
Journal of microelectromechanical systems 14 (2), 368-382, 2005‏
1582005
Inter-and intragranular plasticity mechanisms in ultrafine-grained Al thin films: An in situ TEM study‏
F Mompiou, M Legros, A Boé, M Coulombier, JP Raskin, T Pardoen‏
Acta materialia 61 (1), 205-216, 2013‏
1482013
Micromachined thin-film sensors for SOI-CMOS co-integration‏
J Laconte, D Flandre, JP Raskin‏
Springer Science & Business Media, 2006‏
1482006
Accurate SOI MOSFET characterization at microwave frequencies for device performance optimization and analog modeling‏
JP Raskin, R Gillon, J Chen, D Vanhoenacker-Janvier, JP Colinge‏
IEEE Transactions on Electron Devices 45 (5), 1017-1025, 1998‏
1481998
Junctionless transistors: physics and properties‏
JP Colinge, CW Lee, N Dehdashti Akhavan, R Yan, I Ferain, P Razavi, ...‏
Semiconductor-on-insulator materials for nanoelectronics applications, 187-200, 2011‏
1472011
Comparison of TiSi2, CoSi2, and NiSi for thin‐film silicon‐on‐insulator applications‏
J Chen, JP Colinge, D Flandre, R Gillon, JP Raskin, D Vanhoenacker‏
Journal of the Electrochemical Society 144 (7), 2437, 1997‏
1421997
Analog/RF performance of multiple gate SOI devices: wideband simulations and characterization‏
JP Raskin, TM Chung, V Kilchytska, D Lederer, D Flandre‏
IEEE Transactions on Electron Devices 53 (5), 1088-1095, 2006‏
1372006
New on-chip nanomechanical testing laboratory-applications to aluminum and polysilicon thin films‏
S Gravier, M Coulombier, A Safi, N André, A Boé, JP Raskin, T Pardoen‏
Journal of microelectromechanical systems 18 (3), 555-569, 2009‏
1322009
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مقالات 1–20