| Embedded deterministic test for low cost manufacturing test J Rajski, J Tyszer, M Kassab, N Mukherjee, R Thompson, KH Tsai, ... Proceedings. International Test Conference, 301-310, 2002 | 482 | 2002 |
| Age, body composition, aerobic fitness and health condition as risk factors for musculoskeletal injuries in conscripts T Heir, G Eide Scandinavian journal of medicine & science in sports 6 (4), 222-227, 1996 | 137 | 1996 |
| Injury proneness in infantry conscripts undergoing a physical training programme: smokeless tobacco use, higher age, and low levels of physical fitness are risk factors T Heir, G Eide Scandinavian journal of medicine & science in sports 7 (5), 304-311, 1997 | 133 | 1997 |
| Experiences with Layout-Aware Diagnosis–A Case Study YJ Chang, MT Pang, M Brennan, A Man, M Keim, G Eide, B Benware, ... Electronic Device Failure Analysis 12 (12), 12-18, 2010 | 44 | 2010 |
| Streaming Scan Network (SSN): An Efficient Packetized Data Network for Testing of Complex SoCs JF Côté, M Kassab, W Janiszewski, R Rodrigues, R Meier, B Kaczmarek, ... 2020 IEEE International Test Conference (ITC), 1-10, 2020 | 18 | 2020 |
| Automatic identification of yield limiting layout patterns using root cause deconvolution on volume scan diagnosis data WT Cheng, R Klingenberg, B Benware, W Yang, M Sharma, G Eide, ... 2017 IEEE 26th Asian Test Symposium (ATS), 219-224, 2017 | 13 | 2017 |
| The changing role of diagnosis in yield analysis G Eide, D Appello Test & Measurement World, 43-49, 2010 | 9 | 2010 |
| Avoid throwing darts at a black hole by using Diagnosis-Driven Yield Analysis G Eide Solid State Technology 53 (7), 24-27, 2010 | 8 | 2010 |
| Key impediments to DFT-focused test and how to overcome them K Posse, G Eide International Test Conference, 503-511, 2003 | 7 | 2003 |
| Deriving feature fail rate from silicon volume diagnostics data S Malik, T Herrmann, S Madhavan, R Desineni, C Schuermyer, G Eide IEEE Design & Test 30 (4), 26-34, 2013 | 5 | 2013 |
| Diagnosis of Scan Logic and Diagnosis Driven Failure Analysis S Venkataraman, M Keim, G Eide Microelectronics Failure Analysis: Desk Reference, 199, 2011 | 2 | 2011 |
| Root Cause Deconvolution—The Next Step in Diagnosis Resolution Improvement G Eide White paper: http://www. mentor. com/products/siliconyield/techpubs, 0 | 2 | |
| Employing the stdf v4-2007 standard for scan test data logging M Seuring, M Braun, A Ma, G Eide, K Yang, H Tang IEEE Design & Test of Computers 29 (6), 91-99, 2012 | 1 | 2012 |
| When good DFT goes bad: debugging broken scan chains Y Huang, G Eide Mentor Graphics 18, 2012 | 1 | 2012 |
| Scan diagnostic analysis assists SoC fab debug/process monitoring S Palosh, G Eide Solid State Technology 54 (7), 22-24, 2011 | 1 | 2011 |
| Leveraging Diagnosis for Yield Analysis G Eide, D Appello Design Automation Conference, Anaheim, CA, 13-18, 2010 | 1 | 2010 |
| The Advancement of 1149.10 Y Huang, H Fu, B Deng, E Seng, M Hutner, JF Cote, G Eide 2021 IEEE International Test Conference in Asia (ITC-Asia), 1-1, 2021 | | 2021 |
| Identifying transistor-level yield limiters in the finFET era G Eide, M Graphics EE-Evaluation Engineering 56 (5), 18-20, 2017 | | 2017 |
| Noise cancellation: The new failure and yield analysis superpower G Eide SOLID STATE TECHNOLOGY 57 (4), 37-38, 2014 | | 2014 |
| The Value of Test for Semiconductor Yield Learning G Eide | | 2012 |
Janusz RajskiVice President of Engineering, SiemensVerified email at mentor.com
