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Co-authors
RuFeng ChuWinsense Inc.Verified email at winsense.ai
Stan Z. Li (李子青)Westlake University & CAS Institute of AutomationVerified email at westlake.edu.cn
Shengcai Liao (廖胜才)IEEE Fellow, IAPR Fellow, Associate Professor, United Arab Emirates University (UAEU)Verified email at uaeu.ac.ae
Shiming XiangNational Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of SciencesVerified email at nlpr.ia.ac.cn
Xiangxin ZhuApple Inc.Verified email at apple.com
Zhen Lei(雷震)Professor, IEEE Fellow, IAPR Fellow, Institute of Automation, Chinese Academy of SciencesVerified email at ia.ac.cn
Ran He, IAPR/IEEE FellowNational Laboratory of Pattern Recognition, CASIAVerified email at nlpr.ia.ac.cn
Xiao-Tong YuanNanjing UniversityVerified email at nuist.edu.cn
Li BoBeijing Institute of TechnologyVerified email at bit.edu.cn
Dong YiInstitute of Automation, Chinese Academy of SciencesVerified email at ia.ac.cn