متابعة
John F. Wager
John F. Wager
Professor Emeritus, EECS, Oregon State University
بريد إلكتروني تم التحقق منه على ece.orst.edu
عنوان
عدد مرات الاقتباسات
عدد مرات الاقتباسات
السنة
Semiconductor device
HQ Chiang, RL Hoffman, D Hong, NL Dehuff, JF Wager
US Patent 7,145,174, 2006
38252006
Transistor structures
JF Wager III, RL Hoffman
US Patent 7,339,187, 2008
38152008
ZnO-based transparent thin-film transistors
RL Hoffman, BJ Norris, JF Wager
Applied Physics Letters 82 (5), 733-735, 2003
19402003
High mobility transparent thin-film transistors with amorphous zinc tin oxide channel layer
HQ Chiang, JF Wager, RL Hoffman, J Jeong, DA Keszler
Applied Physics Letters 86 (1), 2005
10392005
Appl
WO Patent 2000078731:A1, 2000
1037*2000
Transparent electronics
JF Wager
science 300 (5623), 1245-1246, 2003
10282003
Transparent thin-film transistors with zinc indium oxide channel layer
NL Dehuff, ES Kettenring, D Hong, HQ Chiang, JF Wager, RL Hoffman, ...
Journal of Applied Physics 97 (6), 2005
5662005
Transparent electronics
JF Wager, DA Keszler, RE Presley
Springer, 2008
4802008
Tin oxide transparent thin-film transistors
RE Presley, CL Munsee, CH Park, D Hong, JF Wager, DA Keszler
Journal of Physics D: Applied Physics 37 (20), 2810, 2004
4792004
Aqueous inorganic inks for low-temperature fabrication of ZnO TFTs
ST Meyers, JT Anderson, CM Hung, J Thompson, JF Wager, DA Keszler
Journal of the American Chemical Society 130 (51), 17603-17609, 2008
4282008
Transistor structures having a transparent channel
JF Wager III, RL Hoffman
US Patent 7,189,992, 2007
3032007
p-Type oxides for use in transparent diodes
J Tate, MK Jayaraj, AD Draeseke, T Ulbrich, AW Sleight, KA Vanaja, ...
Thin solid films 411 (1), 119-124, 2002
2452002
Constant-voltage-bias stress testing of a-IGZO thin-film transistors
K Hoshino, D Hong, HQ Chiang, JF Wager
IEEE Transactions on Electron Devices 56 (7), 1365-1370, 2009
2242009
Transparent ring oscillator based on indium gallium oxide thin-film transistors
RE Presley, D Hong, HQ Chiang, CM Hung, RL Hoffman, JF Wager
Solid-State Electronics 50 (3), 500-503, 2006
2002006
An amorphous oxide semiconductor thin-film transistor route to oxide electronics
JF Wager, B Yeh, RL Hoffman, DA Keszler
Current Opinion in Solid State and Materials Science 18 (2), 53-61, 2014
1992014
Thin film transistor with a passivation layer
R Hoffman, J Wager, D Hong, H Chiang
US Patent 7,382,421, 2008
1992008
Processing effects on the stability of amorphous indium gallium zinc oxide thin-film transistors
HQ Chiang, BR McFarlane, D Hong, RE Presley, JF Wager
Journal of Non-Crystalline Solids 354 (19-25), 2826-2830, 2008
1962008
Iron chalcogenide photovoltaic absorbers
L Yu, S Lany, R Kykyneshi, V Jieratum, R Ravichandran, B Pelatt, ...
Advanced Energy Materials 1 (5), 748-753, 2011
1952011
Advancing MIM electronics: Amorphous metal electrodes
EW Cowell III, N Alimardani, CC Knutson, JF Conley Jr, DA Keszler, ...
Advanced Materials(FRG) 23 (1), 74-78, 2011
1702011
Atomic model for the EL2 defect in GaAs
JF Wager, JA Van Vechten
Physical Review B 35 (5), 2330, 1987
1521987
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مقالات 1–20