| PSP: An advanced surface-potential-based MOSFET model for circuit simulation G Gildenblat, X Li, W Wu, H Wang, A Jha, R Van Langevelde, GDJ Smit, ... IEEE Transactions on Electron Devices 53 (9), 1979-1993, 2006 | 461 | 2006 |
| Scaling of nano-Schottky-diodes GDJ Smit, S Rogge, TM Klapwijk Applied Physics Letters 81 (20), 3852-3854, 2002 | 315 | 2002 |
| Enhanced tunneling across nanometer-scale metal–semiconductor interfaces GDJ Smit, S Rogge, TM Klapwijk Applied Physics Letters 80 (14), 2568-2570, 2002 | 160 | 2002 |
| Best practices for compact modeling in Verilog-A CC McAndrew, GJ Coram, KK Gullapalli, JR Jones, LW Nagel, AS Roy, ... IEEE Journal of the Electron Devices Society 3 (5), 383-396, 2015 | 111 | 2015 |
| Experimental assessment of self-heating in SOI FinFETs AJ Scholten, GDJ Smit, RMT Pijper, LF Tiemeijer, HP Tuinhout, ... 2009 IEEE International Electron Devices Meeting (IEDM), 1-4, 2009 | 88 | 2009 |
| Gate-induced ionization of single dopant atoms GDJ Smit, S Rogge, J Caro, TM Klapwijk Physical Review B 68 (19), 193302, 2003 | 58 | 2003 |
| RF-noise modeling in advanced CMOS technologies GDJ Smit, AJ Scholten, RMT Pijper, LF Tiemeijer, R van der Toorn, ... IEEE Transactions on Electron Devices 61 (2), 245-254, 2013 | 56 | 2013 |
| Stark effect in shallow impurities in Si GDJ Smit, S Rogge, J Caro, TM Klapwijk Physical Review B 70 (3), 035206, 2004 | 55 | 2004 |
| Introduction to PSP MOSFET model G Gildenblat, X Li, H Wang, W Wu, R Van Langevelde, AJ Scholten, ... Proc. the MSM 2005 Int. Conf., Nanotech 2005, 2005 | 54 | 2005 |
| A unified nonquasi-static MOSFET model for large-signal and small-signal simulations H Wang, X Li, W Wu, G Gildenblat, R Van Langevelde, GDJ Smit, ... IEEE transactions on electron devices 53 (9), 2035-2043, 2006 | 51 | 2006 |
| The new CMC standard compact MOS model PSP: Advantages for RF applications AJ Scholten, GDJ Smit, BA De Vries, LF Tiemeijer, JA Croon, ... IEEE Journal of Solid-State Circuits 44 (5), 1415-1424, 2009 | 48 | 2009 |
| The physical background of JUNCAP2 AJ Scholten, GDJ Smit, M Durand, R Van Langevelde, DBM Klaassen IEEE transactions on electron devices 53 (9), 2098-2107, 2006 | 48 | 2006 |
| PSP-based scalable compact FinFET model GDJ Smit, AJ Scholten, G Curatola, R Van Langevelde, G Gildenblat, ... Proc. Nanotech, 520-525, 2007 | 44 | 2007 |
| PSP-based compact FinFET model describing dc and RF measurements GDJ Smit, AJ Scholten, N Serra, RMT Pijper, R van Langevelde, ... 2006 International Electron Devices Meeting, 1-4, 2006 | 41 | 2006 |
| The relation between degradation under DC and RF stress conditions AJ Scholten, D Stephens, GDJ Smit, GT Sasse, J Bisschop IEEE Transactions on Electron Devices 58 (8), 2721-2728, 2011 | 40 | 2011 |
| Benchmark tests for MOSFET compact models with application to the PSP model X Li, W Wu, A Jha, G Gildenblat, R van Langevelde, GDJ Smit, ... IEEE Transactions on Electron Devices 56 (2), 243-251, 2009 | 38 | 2009 |
| Scaling of micro-fabricated nanometer-sized Schottky diodes GDJ Smit, MG Flokstra, S Rogge, TM Klapwijk Microelectronic Engineering 64 (1-4), 429-433, 2002 | 35 | 2002 |
| Surface-potential-based compact model of bulk MOSFET G Gildenblat, W Wu, X Li, R van Langevelde, AJ Scholten, GDJ Smit, ... Compact Modeling: Principles, Techniques and Applications, 3-40, 2010 | 31 | 2010 |
| Symmetric linearization method for double-gate and surrounding-gate MOSFET models G Dessai, A Dey, G Gildenblat, GDJ Smit Solid-state electronics 53 (5), 548-556, 2009 | 31 | 2009 |
| PSP-SOI: An advanced surface potential based compact model of partially depleted SOI MOSFETs for circuit simulations W Wu, X Li, G Gildenblat, GO Workman, S Veeraraghavan, CC McAndrew, ... Solid-State Electronics 53 (1), 18-29, 2009 | 27 | 2009 |
Jurriaan SchmitzMESA+ Institute for Nanotechnology, University of TwenteVerified email at utwente.nl
Jurriaan SchmitzMESA+ Institute for Nanotechnology, University of TwenteVerified email at utwente.nl