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Marcello Traiola
Marcello Traiola
Tenured Research Scientist - Inria Rennes / IRISA lab
Verified email at inria.fr - Homepage
Title
Cited by
Cited by
Year
Investigating data representation for efficient and reliable convolutional neural networks
A Ruospo, E Sanchez, M Traiola, I O’connor, A Bosio
Microprocessors and Microsystems 86, 104318, 2021
332021
Test and reliability in approximate computing
L Anghel, M Benabdenbi, A Bosio, M Traiola, EI Vatajelu
Journal of Electronic Testing 34 (4), 375-387, 2018
302018
Multi-objective application-driven approximate design method
S Barone, M Traiola, M Barbareschi, A Bosio
IEEE Access 9, 86975-86993, 2021
232021
A survey of testing techniques for approximate integrated circuits
M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
Proceedings of the IEEE 108 (12), 2178-2194, 2020
202020
Testing approximate digital circuits: Challenges and opportunities
M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018
192018
A survey on deep learning resilience assessment methodologies
A Ruospo, E Sanchez, LM Luza, L Dilillo, M Traiola, A Bosio
Computer 56 (2), 57-66, 2023
182023
Predicting the impact of functional approximation: From component-to application-level
M Traiola, A Savino, M Barbareschi, S Di Carlo, A Bosio
2018 IEEE 24th International Symposium on On-Line Testing And Robust System …, 2018
172018
Qamr: an approximation-based fully reliable tmr alternative for area overhead reduction
B Deveautour, M Traiola, A Virazel, P Girard
2020 IEEE European test symposium (ETS), 1-6, 2020
162020
Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications
M Traiola, A Savino, S Di Carlo
Microelectronics Reliability 102, 113309, 2019
162019
A test pattern generation technique for approximate circuits based on an ILP-formulated pattern selection procedure
M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
IEEE Transactions on Nanotechnology 18, 849-857, 2019
152019
Towards approximation during test of integrated circuits
I Wali, M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
2017 IEEE 20th International Symposium on Design and Diagnostics of …, 2017
152017
Xbargen: A memristor based boolean logic synthesis tool
M Traiola, M Barbareschi, A Mazzeo, A Bosio
2016 IFIP/IEEE International Conference on Very Large Scale Integration …, 2016
142016
On the comparison of different atpg approaches for approximate integrated circuits
M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
2018 IEEE 21st International Symposium on Design and Diagnostics of …, 2018
132018
Design, verification, test and in-field implications of approximate computing systems
A Bosio, S Di Carlo, P Girard, E Sanchez, A Savino, L Sekanina, M Traiola, ...
2020 IEEE European Test Symposium (ETS), 1-10, 2020
122020
Emerging computing devices: Challenges and opportunities for test and reliability
A Bosio, I O’Connor, M Traiola, J Echavarria, J Teich, MA Hanif, ...
2021 IEEE European test symposium (ETS), 1-10, 2021
112021
Selective hardening of critical neurons in deep neural networks
A Ruospo, G Gavarini, I Bragaglia, M Traiola, A Bosio, E Sanchez
2022 25th International Symposium on Design and Diagnostics of Electronic …, 2022
102022
Maximizing yield for approximate integrated circuits
M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 810-815, 2020
102020
Estimating dynamic power consumption for memristor-based CiM architecture
M Traiola, M Barbareschi, A Bosio
Microelectronics Reliability 80, 241-248, 2018
102018
A Genetic-algorithm-based Approach to the Design of DCT Hardware Accelerators
M Barbareschi, S Barone, A Bosio, J Han, M Traiola
ACM Journal on Emerging Technologies in Computing Systems (JETC) 18 (3), 1-25, 2022
92022
Evaluating data encryption effects on the resilience of an artificial neural network
R Cantoro, NI Deligiannis, MS Reorda, M Traiola, E Valea
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020
92020
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