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BAGGIO J.
BAGGIO J.
Verified email at cea.fr
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Cited by
Year
Statistical analysis of the charge collected in SOI and bulk devices under heavy lon and proton irradiation—Implications for digital SETs
V Ferlet-Cavrois, P Paillet, M Gaillardin, D Lambert, J Baggio, ...
IEEE Transactions on Nuclear Science 53 (6), 3242-3252, 2006
1972006
New insights into single event transient propagation in chains of inverters—Evidence for propagation-induced pulse broadening
V Ferlet-Cavrois, P Paillet, D McMorrow, N Fel, J Baggio, S Girard, ...
IEEE Transactions on Nuclear Science 54 (6), 2338-2346, 2007
1752007
Impact of heavy ion energy and nuclear interactions on single-event upset and latchup in integrated circuits
PE Dodd, JR Schwank, MR Shaneyfelt, JA Felix, P Paillet, ...
IEEE Transactions on Nuclear Science 54 (6), 2303-2311, 2007
1452007
Effects of particle energy on proton-induced single-event latchup
JR Schwank, MR Shaneyfelt, J Baggio, PE Dodd, JA Felix, ...
IEEE transactions on nuclear science 52 (6), 2622-2629, 2005
1292005
Radiation effects on silica-based preforms and optical fibers—I: Experimental study with canonical samples
S Girard, Y Ouerdane, G Origlio, C Marcandella, A Boukenter, N Richard, ...
IEEE Transactions on Nuclear Science 55 (6), 3473-3482, 2008
1122008
Proton-and gamma-induced effects on erbium-doped optical fibers
S Girard, B Tortech, E Regnier, M Van Uffelen, A Gusarov, Y Ouerdane, ...
IEEE transactions on nuclear science 54 (6), 2426-2434, 2007
1032007
Radiation effects on Ytterbium-and Ytterbium/Erbium-doped double-clad optical fibers
S Girard, Y Ouerdane, B Tortech, C Marcandella, T Robin, B Cadier, ...
IEEE Transactions on Nuclear Science 56 (6), 3293-3299, 2009
842009
14-MeV Neutron, -Ray, and Pulsed X-Ray Radiation-Induced Effects on Multimode Silica-Based Optical Fibers
S Girard, J Baggio, J Bisutti
IEEE Transactions on Nuclear Science 53 (6), 3750-3757, 2006
762006
Effects of total dose irradiation on single-event upset hardness
JR Schwank, MR Shaneyfelt, JA Felix, PE Dodd, J Baggio, ...
IEEE transactions on nuclear science 53 (4), 1772-1778, 2006
752006
Single event upsets induced by 1–10 MeV neutrons in static-RAMs using mono-energetic neutron sources
J Baggio, D Lambert, V Ferlet-Cavrois, P Paillet, C Marcandella, ...
IEEE Transactions on Nuclear Science 54 (6), 2149-2155, 2007
682007
Charge enhancement effect in NMOS bulk transistors induced by heavy ion irradiation-comparison with SOI
V Ferlet-Cavrois, G Vizkelethy, P Paillet, A Torres, JR Schwank, ...
IEEE transactions on nuclear science 51 (6), 3255-3262, 2004
682004
SEU sensitivity of bulk and SOI technologies to 14-MeV neutrons
G Gasiot, V Ferlet-Cavrois, J Baggio, P Roche, P Flatresse, A Guyot, ...
IEEE Transactions on Nuclear Science 49 (6), 3032-3037, 2002
662002
Effects of angle of incidence on proton and neutron-induced single-event latchup
JR Schwank, MR Shaneyfelt, J Baggio, PE Dodd, JA Felix, ...
IEEE transactions on nuclear science 53 (6), 3122-3131, 2006
612006
New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers
JL Bourgade, V Allouche, J Baggio, C Bayer, F Bonneau, C Chollet, ...
Review of scientific instruments 75 (10), 4204-4212, 2004
612004
Diagnostic components in harsh radiation environments: Possible overlap in R&D requirements of inertial confinement and magnetic fusion systems
JL Bourgade, AE Costley, R Reichle, ER Hodgson, W Hsing, V Glebov, ...
Review of Scientific Instruments 79 (10), 10F304, 2008
582008
Transient optical absorption in pulsed-X-ray-irradiated pure-silica-core optical fibers: Influence of self-trapped holes
S Girard, DL Griscom, J Baggio, B Brichard, F Berghmans
Journal of non-crystalline Solids 352 (23-25), 2637-2642, 2006
552006
Issues for single-event proton testing of SRAMs
JR Schwank, PE Dodd, MR Shaneyfelt, JA Felix, GL Hash, ...
IEEE transactions on nuclear science 51 (6), 3692-3700, 2004
552004
Analysis of proton/neutron SEU sensitivity of commercial SRAMs-application to the terrestrial environment test method
J Baggio, V Ferlet-Cavrois, H Duarte, O Flament
IEEE transactions on nuclear science 51 (6), 3420-3426, 2004
512004
Neutron-induced SEU in bulk SRAMs in terrestrial environment: Simulations and experiments
D Lambert, J Baggio, V Ferlet-Cavrois, O Flament, F Saigne, B Sagnes, ...
IEEE transactions on nuclear science 51 (6), 3435-3441, 2004
502004
Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs
JA Pellish, RA Reed, D McMorrow, G Vizkelethy, VF Cavrois, J Baggio, ...
IEEE Transactions on Nuclear Science 56 (6), 3078-3084, 2009
492009
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