Follow
Pan Yan
Title
Cited by
Cited by
Year
Firefly: Illuminating future network-on-chip with nanophotonics
Y Pan, P Kumar, J Kim, G Memik, Y Zhang, A Choudhary
Proceedings of the 36th annual international symposium on Computer …, 2009
5322009
Flexishare: Channel sharing for an energy-efficient nanophotonic crossbar
Y Pan, J Kim, G Memik
HPCA-16 2010 The Sixteenth International Symposium on High-Performance …, 2010
2472010
Power to the people: Leveraging human physiological traits to control microprocessor frequency
A Shye, Y Pan, B Scholbrock, JS Miller, G Memik, PA Dinda, RP Dick
2008 41st IEEE/ACM International Symposium on Microarchitecture, 188-199, 2008
752008
Galaxy: A high-performance energy-efficient multi-chip architecture using photonic interconnects
Y Demir, Y Pan, S Song, N Hardavellas, J Kim, G Memik
Proceedings of the 28th ACM international conference on Supercomputing, 303-312, 2014
702014
Exploring concentration and channel slicing in on-chip network router
P Kumar, Y Pan, J Kim, G Memik, A Choudhary
2009 3rd ACM/IEEE International Symposium on Networks-on-Chip, 276-285, 2009
672009
Selective wordline voltage boosting for caches to manage yield under process variations
Y Pan, J Kong, S Ozdemir, G Memik, SW Chung
Proceedings of the 46th annual design automation conference, 57-62, 2009
462009
Featherweight: low-cost optical arbitration with qos support
Y Pan, J Kim, G Memik
Proceedings of the 44th Annual IEEE/ACM International Symposium on …, 2011
432011
Leveraging root cause deconvolution analysis for logic yield ramping
Y Pan, A Chittora, K Sekar, GS Huat, YG Feng, A Viswanatha, J Lam
ISTFA 2013, 602-607, 2013
242013
Quantifying and coping with parametric variations in 3D-stacked microarchitectures
S Ozdemir, Y Pan, A Das, G Memik, G Loh, A Choudhary
Proceedings of the 47th Design Automation Conference, 144-149, 2010
222010
Effectiveness of frequency mapping on 28 nm device broken scan chain failures
SH Goh, Y Pan, GF You, YH Chan, T Herrman, T Heller, VSK Lim, ZH Mai, ...
Review of Scientific Instruments 83 (2), 2012
162012
Automatic identification of yield limiting layout patterns using root cause deconvolution on volume scan diagnosis data
WT Cheng, R Klingenberg, B Benware, W Yang, M Sharma, G Eide, ...
2017 IEEE 26th Asian Test Symposium (ATS), 219-224, 2017
122017
Systematic defect detection methodology for volume diagnosis: A data mining perspective
C Shan, P Babighian, Y Pan, J Carulli, LC Wang
2017 IEEE International Test Conference (ITC), 1-10, 2017
122017
Tuning nanophotonic on-chip network designs for improving memory trafics
Y Pan, J Kim, G Memik
PICA@ MICRO2009, 2011
112011
Fine-grain voltage tuned cache architecture for yield management under process variations
J Kong, Y Pan, S Ozdemir, A Mohan, G Memik, SW Chung
IEEE transactions on very large scale integration (VLSI) systems 20 (8 …, 2011
102011
System and method for leveraging human physiological traits to control microprocessor frequency
A Shye, Y Pan, B Scholbrock, JS Miller, G Memik, PA Dinda, RP Dick
US Patent 8,683,242, 2014
82014
Net tracing and classification analysis on E-beam die-to-database inspection
W Gao, X Zeng, P Lin, Y Pan, HY Song, H Nguyen, N Cai, Z Chen, K Zafar
Metrology, Inspection, and Process Control for Microlithography XXX 9778 …, 2016
72016
SpotMe effective co-optimization of design and defect inspection for fast yield ramp
Y Pan, R Desineni, J Lambert, E Teoh, T Berndt, V Lim, GS Huat, J Kim, ...
ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference, 200-205, 2013
72013
Exploring benefits and designs of optically connected disintegrated processor architecture
Y Pan, Y Demir, N Hardavellas, J Kim, G Memik
Workshop on the Interaction between Nanophotonic Devices and Systems (in …, 2010
62010
Yield learning for complex finfet defect mechanisms based on volume scan diagnosis results
H Tang, M Sharma, WT Cheng, G Veda, D Gehringer, M Knowles, ...
2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2019
52019
Application of Bayesian Machine Learning To Create A Low-Cost Silicon Failure Mechanism Pareto
C Schuermyer, S Palosh, P Babighian, Y Pan
2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2019
42019
The system can't perform the operation now. Try again later.
Articles 1–20