Test data analytics—Exploring spatial and test-item correlations in production test data CK Hsu, F Lin, KT Cheng, W Zhang, X Li, JM Carulli, KM Butler 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 42 | 2013 |
Fast Dimensional Analysis for Root Cause Investigation in Large-Scale Service Environment F Lin, K Muzumdar, NP Laptev, MV Curelea, S Lee, S Sankar ACM SIGMETRICS, 2020 | 39 | 2020 |
An artificial neural network approach for screening test escapes F Lin, KT Cheng 2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC), 414-419, 2017 | 17 | 2017 |
Hardware Remediation At Scale FF Lin, M Beadon, HD Dixit, G Vunnam, A Desai, S Sankar IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2018 | 16 | 2018 |
Feature engineering with canonical analysis for effective statistical tests screening test escapes F Lin, CK Hsu, KT Cheng 2014 International Test Conference, 1-10, 2014 | 15 | 2014 |
Learning from production test data: Correlation exploration and feature engineering F Lin, CK Hsu, KT Cheng 2014 IEEE 23rd Asian Test Symposium, 236-241, 2014 | 14 | 2014 |
Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction S Zhang, F Lin, CK Hsu, KT Cheng, H Wang 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014 | 14 | 2014 |
Predicting Remediations for Hardware Failures in Large-Scale Datacenters F Lin, A Davoli, I Akbar, S Kalmanje, L Silva, J Stamford, Y Golany, ... IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2020 | 13 | 2020 |
Adatest: An efficient statistical test framework for test escape screening F Lin, CK Hsu, KT Cheng 2015 IEEE International Test Conference (ITC), 1-8, 2015 | 13 | 2015 |
Near-Realtime Server Reboot Monitoring and Root Cause Analysis in a Large-Scale System F Lin, B Bolla, E Pinkham, N Kodner, D Moore, A Desai, S Sankar | 6* | |
Pairwise proximity-based features for test escape screening F Lin, CK Hsu, AG Busetto, KT Cheng 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 300-306, 2015 | 5 | 2015 |
Optimizing Interrupt Handling Performance for Memory Failures in Large Scale Data Centers HD Dixit, F Lin, B Holland, M Beadon, Z Yang, S Sankar ACM/SPEC International Conference on Performance Engineering, 2020 | 2 | 2020 |
Evaluating Robustness of Deep Learning-based Recommendation Systems against Hardware Errors: A Case Study SS Xun Jiao, Fred Lin, Matt Xiao, Alban Desmaison, Daniel Moore IEEE Real-Time Systems Symposium, 2023 | | 2023 |
Hard Disk Drive Failure Analysis and Prediction: An Industry View FL Zach Miller, Olusiji Medaiyese, Madhavan Ravi, Alex Beatty IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2023 | | 2023 |
Industry Track Programme Committee DSN 2021 N Kanekawa, HV Ramasamy, R Bertrand, L Di Martino, M Hiltunen, ... | | |
Industry Track Programme Committee DSN 2020 F Brancati, C Constantinescu, J Currey, L Di Martino, J Lala, B Hall, ... | | |