Follow
Wenjian Liu
Title
Cited by
Cited by
Year
A room-temperature magnetic semiconductor from a ferromagnetic metallic glass
W Liu, H Zhang, J Shi, Z Wang, C Song, X Wang, S Lu, X Zhou, L Gu, ...
Nature communications 7 (1), 13497, 2016
872016
6.2 W/Mm and record 33.8% PAE at 94 GHz from N-polar GaN deep recess MIS-HEMTs with ALD Ru gates
W Liu, B Romanczyk, M Guidry, N Hatui, C Wurm, W Li, P Shrestha, ...
IEEE Microwave and Wireless Components Letters 31 (6), 748-751, 2021
452021
An improved methodology for extracting interface state density at Si3N4/GaN
W Liu, I Sayed, C Gupta, H Li, S Keller, U Mishra
Applied Physics Letters 116 (2), 2020
262020
Record RF power performance at 94 GHz from millimeter-wave N-polar GaN-on-sapphire deep-recess HEMTs
W Li, B Romanczyk, M Guidry, E Akso, N Hatui, C Wurm, W Liu, ...
IEEE Transactions on Electron Devices 70 (4), 2075-2080, 2023
182023
Net negative fixed interface charge for Si3N4 and SiO2 grown in situ on 000-1 N-polar GaN
I Sayed, W Liu, S Chan, C Gupta, M Guidry, H Li, S Keller, U Mishra
Applied Physics Letters 115 (3), 2019
182019
Characterization of AlSiO dielectrics with varying silicon composition for N-polar GaN-based devices
I Sayed, W Liu, J Georgieva, A Krishna, S Keller, UK Mishra
Semiconductor Science and Technology 35 (9), 095027, 2020
142020
Electrical properties and interface abruptness of alsio gate dielectric grown on 0001 n-polar and (0001) ga-polar gan
I Sayed, B Bonef, W Liu, S Chan, J Georgieva, JS Speck, S Keller, ...
Applied Physics Letters 115 (17), 2019
142019
Characterization of MOCVD-grown AlSiO gate dielectric on β-Ga2O3 (001)
ZA Jian, I Sayed, W Liu, S Mohanty, E Ahmadi
Applied Physics Letters 118 (17), 2021
132021
Transparent magnetic semiconductor with embedded metallic glass nano-granules
N Chen, H Li, A Hirata, Z Luo, Z Wang, W Liu, B Cui, T Hitosugi, L Gu, ...
Materials & Design 132, 208-214, 2017
122017
Amorphous magnetic semiconductors with Curie temperatures above room temperature
N Chen, K Fang, H Zhang, Y Zhang, W Liu, K Yao, Z Zhang
Journal of Semiconductors 40 (8), 081510, 2019
112019
First demonstration of four-finger N-polar GaN HEMT exhibiting record 712-mW output power with 31.7% PAE at 94 GHz
E Akso, H Collins, C Clymore, W Li, M Guidry, B Romanczyk, C Wurm, ...
IEEE Microwave and Wireless Technology Letters, 2023
92023
A systematic and quantitative analysis of the bulk and interfacial properties of the AlSiO dielectric on N-polar GaN using capacitance–voltage methods
W Liu, I Sayed, J Georgieva, S Chan, S Keller, UK Mishra
Journal of Applied Physics 128 (7), 2020
92020
Improved operation stability of in situ AlSiO dielectric grown on (000–1) N-polar GaN by MOCVD
I Sayed, W Liu, B Romanczyk, J Georgieva, S Chan, S Keller, UK Mishra
Applied Physics Express 13 (6), 061010, 2020
92020
Record 94 GHz performance from N-polar GaN-on-sapphire MIS-HEMTs: 5.8 W/mm and 38.5% PAE
W Li, B Romanczyk, E Akso, M Guidry, N Hatui, C Wurm, W Liu, ...
2022 International Electron Devices Meeting (IEDM), 11.2. 1-11.2. 4, 2022
82022
Ru/N-Polar GaN Schottky Diode With Less Than 2 μA/cm² Reverse Current
W Liu, I Sayed, B Romanczyk, N Hatui, M Guidry, WJ Mitchell, S Keller, ...
IEEE Electron Device Letters 41 (10), 1468-1471, 2020
82020
Improved N-polar GaN mm-wave linearity, efficiency, and noise
M Guidry, P Shrestha, W Liu, B Romanczyk, N Hatui, C Wurm, R Karnaty, ...
2022 IEEE/MTT-S International Microwave Symposium-IMS 2022, 291-294, 2022
72022
Flatband voltage stability and time to failure of MOCVD-grown SiO2 and Si3N4 dielectrics on N-polar GaN
I Sayed, W Liu, S Chan, C Gupta, H Li, S Keller, UK Mishra
Applied Physics Express 12 (12), 121001, 2019
72019
Improved operational reliability of MOCVD-grown AlSiO gate dielectric on β-Ga2O3 (001) by post-metallization annealing
ZA Jian, I Sayed, S Mohanty, W Liu, E Ahmadi
Semiconductor Science and Technology 36 (9), 09LT03, 2021
62021
Metallic glass-strengthened thermoplastic elastomer composites
X Liu, H Liu, D Wang, E Wang, W Liu, K Yao, N Chen
Physica E: Low-dimensional Systems and Nanostructures 90, 37-41, 2017
62017
GaN/AlGaN superlattice based E-mode hole channel FinFET with Schottky gate
A Raj, A Krishna, B Romanczyk, N Hatui, W Liu, S Keller, UK Mishra
IEEE Electron Device Letters 44 (1), 9-12, 2022
52022
The system can't perform the operation now. Try again later.
Articles 1–20