Khan M Farhan Shahil
Khan M Farhan Shahil
INTEL Corp.
Verified email at ee.ucr.edu
Title
Cited by
Cited by
Year
Graphene–multilayer graphene nanocomposites as highly efficient thermal interface materials
KMF Shahil, AA Balandin
Nano letters 12 (2), 861-867, 2012
11292012
Thermal properties of graphene and multilayer graphene: Applications in thermal interface materials
KMF Shahil, AA Balandin
Solid State Communications 152 (15), 1331-1340, 2012
6412012
Micro-Raman spectroscopy of mechanically exfoliated few-quintuple layers of Bi2Te3, Bi2Se3, and Sb2Te3 materials
KMF Shahil, MZ Hossain, V Goyal, AA Balandin
Journal of Applied Physics 111 (5), 054305, 2012
1952012
Crystal symmetry breaking in few-quintuple films: Applications in nanometrology of topological insulators
KMF Shahil, MZ Hossain, D Teweldebrhan, AA Balandin
Applied physics letters 96 (15), 153103, 2010
1782010
Low-frequency current fluctuations in “graphene-like” exfoliated thin-films of bismuth selenide topological insulators
MZ Hossain, SL Rumyantsev, KMF Shahil, D Teweldebrhan, M Shur, ...
ACS nano 5 (4), 2657-2663, 2011
692011
Thermal properties of graphene: Applications in thermal interface materials
KM Shahil, V Goyal, A Balandin
ECS transactions 35 (3), 193, 2011
222011
1/f noise in conducting channels of topological insulator materials
MZ Hossain, SL Rumyantsev, D Teweldebrhan, KMF Shahil, M Shur, ...
physica status solidi (a) 208 (1), 144-146, 2011
212011
Graphene-based thermal interface materials
KMF Shahil, AA Balandin
2011 11th IEEE International Conference on Nanotechnology, 1193-1196, 2011
52011
Graphene fillers for ultra-efficient thermal interface materials
KMF Shahil, V Goyal, R Gulotty, AA Balandin
2012 IEEE Silicon Nanoelectronics Workshop (SNW), 1-2, 2012
22012
Study of charge trapping/detrapping mechanism in SiO2/HfO2 stack gate dielectrics considering two-way detrapping
KMF Shahil, MN Arafat, QDM Khosru, MR Khan
2007 International Workshop on Electron Devices and Semiconductor Technology …, 2007
22007
Quasi 2D Materials: Raman Nanometrology and Thermal Management Applications
KMF Shahil
UC Riverside, 2012
2012
Low-frequency 1/f noise in bismuth selenide Topological Insulators
MZ Hossain, KMF Shahil, D Teweldebrhan, AA Balandin, SL Rumyantsev, ...
2011 21st International Conference on Noise and Fluctuations, 480-482, 2011
2011
Low-Frequency Current Fluctuations in Graphene-like Exfoliated Thin-Films of Topological Insulators
MZ Hossain, SL Rumyantsev, KMF Shahil, D Teweldebrhan, M Shur, ...
arXiv preprint arXiv:1102.0961, 2011
2011
Graphene Reinforced Composites as Efficient Thermal Interface Materials
K Shahil, S Subrina, A Balandin
Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box …, 2011
2011
Low-Frequency Noise in “Graphene-Like” Exfoliated Thin Films of Topological Insulators
MZ Hossain, SL Rumyantsev, KMF Shahil, D Teweldebrhan, M Shur, ...
MRS Online Proceedings Library Archive 1344, 2011
2011
1/f Noise in Thin Films of Topological Insulator Materials
MZ Hossain, SL Rumyantsev, D Teweldebrhan, KMF Shahil, M Shur, ...
arXiv preprint arXiv:1010.0420, 2010
2010
1/f Noise in Thin Films of Topological Insulator Materials
M Zahid Hossain, SL Rumyantsev, D Teweldebrhan, KMF Shahil, M Shur, ...
arXiv, arXiv: 1010.0420, 2010
2010
Modeling of Post Soft Breakdown Conduction through Ultrathin High-k Gate Dielectrics
KMF Shahil, MN Arafat, QDM Khosru, MR Khan
2007 IEEE Conference on Electron Devices and Solid-State Circuits, 177-180, 2007
2007
Modeling and characterization of soft breakdown phenomena in MOS devices with ultrathin high-κ gate dielectric
KMF Shahil, N Arafat, QDM Khosru, MR Khan
2007 International Semiconductor Device Research Symposium, 1-2, 2007
2007
Aboutalebi, Seyed Hamed, 17 Ashraf, Khalid, 107
PAS Autreto, AA Balandin, B Bhanu, V Bouchiat, G Cao, J Cao, MT Chen, ...
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