| Strain coupling optimization in magnetoelectric transducers D Tierno, F Ciubotaru, R Duflou, M Heyns, IP Radu, C Adelmann Microelectronic Engineering 187, 144-147, 2018 | 10 | 2018 |
| Cryo-computing for infrastructure applications: A technology-to-microarchitecture co-optimization study D Prasad, M Vangala, M Bhargava, A Beckers, A Grill, D Tierno, ... 2022 International Electron Devices Meeting (IEDM), 23.5. 1-23.5. 4, 2022 | 9 | 2022 |
| Dielectric reliability study of 21 nm pitch interconnects with barrierless Ru fill A Leśniewska, PJ Roussel, D Tierno, VV Gonzalez, MH van der Veen, ... 2020 IEEE international reliability physics symposium (IRPS), 1-6, 2020 | 9 | 2020 |
| Microwave Characterization of Ba-substituted PZT and ZnO Thin Films D Tierno, M Dekkers, P Wittendorp, X Sun, SC Bayer, ST King, ... IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 65 …, 2018 | 9 | 2018 |
| Reliability of barrierless PVD Mo D Tierno, M Hosseini, M van der Veen, A Dangol, K Croes, S Demuynck, ... 2021 IEEE International Interconnect Technology Conference (IITC), 1-3, 2021 | 7 | 2021 |
| Cobalt and Ruthenium drift in ultra-thin oxides D Tierno, OV Pedreira, C Wu, N Jourdan, L Kljucar, Z Tőkei, K Croes Microelectronics Reliability, 113407, 2019 | 6 | 2019 |
| Reliability investigation of W2W hybrid bonding interface: Breakdown voltage and leakage mechanism L Hou, E Chery, K Croes, D Tierno, SA Chew, Y Chen, P Rakbin, E Beyne 2022 IEEE International Reliability Physics Symposium (IRPS), 4C. 2-1-4C. 2-6, 2022 | 5 | 2022 |
| Temperature-dependent resistivity of alternative metal thin films M Siniscalchi, D Tierno, K Moors, Z Tőkei, C Adelmann Applied physics letters 117 (4), 2020 | 5 | 2020 |
| BPZT HBARs for magnetoelastic stress generation at GHz frequencies UK Bhaskar, D Tierno, G Talmelli, F Ciubotaru, C Adelmann, T Devolder IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 67 …, 2020 | 5 | 2020 |
| Semi-damascene integration of a 2-layer MOL VHV scaling booster to enable 4-track standard cells V Vega-Gonzalez, D Radisic, S Choudhury, D Tierno, A Thiam, D Batuk, ... 2022 International Electron Devices Meeting (IEDM), 23.2. 1-23.2. 4, 2022 | 4 | 2022 |
| Reliability of Mo as Word Line Metal in 3D NAND D Tierno, K Croes, A Ajaykumar, S Ramesh, G Van den Bosch, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021 | 2 | 2021 |
| Selective ALD Mo Deposition in 10nm Contacts MH van der Veen, JW Maes, OV Pedreira, C Zhu, D Tierno, S Datta, ... 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE …, 2023 | 1 | 2023 |
| Resistance modeling of short-range connections: impact of current spreading D Tierno, V Vega-Gonzalez, S Esposto, I Ciofi Japanese Journal of Applied Physics 62 (SC), SC1034, 2023 | 1 | 2023 |
| ALD Mo for Advanced MOL Local Interconnects M Hosseini, D Tierno, JW Maes, C Zhu, S Datta, Y Byun, M Mousa, ... 2022 IEEE International Interconnect Technology Conference (IITC), 145-147, 2022 | 1 | 2022 |
| Experimental study of time-dependent dielectric degradation by means of random telegraph noise spectroscopy N Saini, D Tierno, K Croes, V Afanas’ev, J Van Houdt Solid-State Electronics, 108877, 2024 | | 2024 |
| Experimental Study Of Interface & Bulk Defectivity In Ultra-Thin BEOL Dielectrics By Using Low Frequency Noise Spectroscopy N Saini, D Tierno, K Croes, V Afanas’ev 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE …, 2023 | | 2023 |
| Exploring the Benefits of Cryogenic Temperatures for Co and Ru Metallizations D Tierno, I Ciofi, OV Pedreira, B Parvais, K Croes 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE …, 2023 | | 2023 |
| A new methodology for modeling Air-Gap TDDB Y Fang, I Ciofi, P Roussel, A Lesniewska, R Degraeve, D Tierno, I De Wolf, ... 2022 IEEE International Interconnect Technology Conference (IITC), 67-69, 2022 | | 2022 |
| (Invited) Magnetoelectrics at Nanometer and Gigahertz Scales for Advanced Spintronic Computing Applications C Adelmann, D Tierno, G Talmelli, D Narducci, H Ahmad, M Geilen, ... Electrochemical Society Meeting Abstracts 240, 621-621, 2021 | | 2021 |
| Impact of surface condition on Cobalt drift into LK3. 0 films D Tierno, A Lesniewska, L Kljucar, MH van der Veen, Z Tőkei, K Croes 2020 IEEE International Interconnect Technology Conference (IITC), 142-144, 2020 | | 2020 |
