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Kareem Madkour
Kareem Madkour
Product Lead, Mentor Graphics
Verified email at mentor.com
Title
Cited by
Cited by
Year
Hotspot detection based on machine learning
JAT Robles, SM Fahmy, K Madkour, JY Wuu
US Patent 8,402,397, 2013
1232013
Hybrid hotspot detection
JAT Robles, SM Fahmy, PLR Beshay, K Madkour, FG Pikus, JY Wuu, ...
US Patent 8,504,949, 2013
252013
Multiple-imaging in 2-D MMI silicon hollow waveguides
A Yehia, K Madkour, H Maaty, D Khalil
IEEE Photonics Technology Letters 16 (9), 2072-2074, 2004
252004
Machine learning-based hotspot detection: Fallacies, pitfalls and marching orders
GR Reddy, K Madkour, Y Makris
2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2019
242019
Hotspot detection using machine learning
K Madkour, S Mohamed, D Tantawy, M Anis
2016 17th International Symposium on Quality Electronic Design (ISQED), 405-409, 2016
232016
Multi-selection method for physical design verification applications
S Mostafa, JA Torres, P Rezk, K Madkour
Design for Manufacturability through Design-Process Integration V 7974, 32-39, 2011
162011
Enhanced OPC recipe coverage and early hotspot detection through automated layout generation and analysis
A Hamouda, M Bahnas, D Schumacher, I Graur, A Chen, K Madkour, H Ali, ...
Optical Microlithography XXX 10147, 223-231, 2017
152017
High coverage of litho hotspot detection by weak pattern scoring
J Park, NJ Kim, J Kang, SW Paek, S Kwon, M Shafee, K Madkour, ...
Design-Process-Technology Co-optimization for Manufacturability IX 9427, 13-20, 2015
152015
The effect of calibration feature weighting on OPC optical and resist models: investigating the influence on model coefficients and on the overall model fitting
A Abdo, R Fathy, K Madkour, J Oberschmidt, D Fischer, M Talbi
25th Annual BACUS Symposium on Photomask Technology 5992, 1470-1477, 2005
122005
Design space exploration for early identification of yield limiting patterns
H Li, E Zou, R Lee, S Hong, S Liu, JY Wang, C Du, R Zhang, K Madkour, ...
Design-Process-Technology Co-optimization for Manufacturability X 9781, 285-292, 2016
102016
Silicon hollow waveguide for MEMS applications
K Madkour, H Maaty, T Badreldin, B Saadany, D Khalil
Proceedings of the European Conference on Optical Communication …, 2003
102003
Early stage hot spot analysis through standard cell base random pattern generation
JW Jeon, J Song, JL Kim, S Park, SH Yang, S Lee, H Kang, K Madkour, ...
Design-Process-Technology Co-optimization for Manufacturability XI 10148 …, 2017
92017
Machine learning to improve accuracy of fast lithographic hotspot detection
NJ Kim, K Park, J Oh, S Jung, S Lee, J Kang, SW Paek, K Madkour, ...
Design-Process-Technology Co-optimization for Manufacturability XIII 10962 …, 2019
62019
A random generation approach to pattern library creation for full chip lithographic simulation
E Zou, S Hong, L Liu, L Huang, L Yang, A Kabeel, K Madkour, ...
Design-Process-Technology Co-optimization for Manufacturability XI 10148 …, 2017
62017
A novel algorithm for automatic arrays detection in a layout
M Shafee, JW Park, A Aslyan, A Torres, K Madkour, W ElManhawy
Design for Manufacturability through Design-Process Integration VII 8684 …, 2013
62013
Toward automated parasitic extraction of silicon photonics using layout physical verifications
M Ismail, RS El Shamy, K Madkour, S Hammouda, MA Swillam
Journal of Optics 18 (8), 085801, 2016
52016
Layout regularity metric as a fast indicator of high variability circuits
E Swillam, K Madkour, M Anis
2013 IEEE International SOC Conference, 43-48, 2013
52013
Model based hint for litho hotspot fixing beyond 20nm node
JH Kang, BM Kim, N Ha, H bok Choi, K sup Kim, S Mohamed, K Madkour, ...
Design for Manufacturability through Design-Process Integration VII 8684 …, 2013
52013
Method For Improving Circuit Design Robustness
FG Pikus, K Madkour
US Patent App. 13/018,204, 2012
52012
A weak pattern random creation and scoring method for lithography process tuning
M Zhang, G Deng, M Wang, S Yu, X Hu, C Du, Q Wan, Z Liu, G Gao, ...
Design-Process-Technology Co-optimization for Manufacturability XII 10588 …, 2018
42018
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