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Co-authors
Wade TrappeProfessor, Electrical and Computer Engineering, WINLAB, Rutgers UniversityVerified email at winlab.rutgers.edu
Yanyong ZhangUniversity of Science and Technology of China ; Rutgers University (Adjunct Visiting Professor)Verified email at ustc.edu.cn
Xiaoyu JiZhejiang UniversityVerified email at zju.edu.cn
Kevin FuAssociate Professor, University of Michigan EECSVerified email at umich.edu
Hossen Asiful Mustafa, PhDBangladesh University of Engineering and Technology (BUET)Verified email at iict.buet.ac.bd
Chen YanZhejiang University, College of Electrical EngineeringVerified email at zju.edu.cn
Zhenhua LiuComputer science and engineering, University of south carolinaVerified email at email.sc.edu
Hongbo LiuUniversity of Electronic Science and Technology of ChinaVerified email at uestc.edu.cn
Zhiyun LinProfessor of Electrical Engineering, Zhejiang UniversityVerified email at zju.edu.cn
Timothy WoodAssociate Professor, The George Washington UniversityVerified email at gwu.edu
Marco GruteserResearch Scientist, Google; former P. Cherasia Scholar & Professor, RutgersVerified email at winlab.rutgers.edu
Weili HanFudan UniversityVerified email at fudan.edu.cn
Pandurang KamatVerified email at persistent.co.in