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Dr. Gokul Kumar
Dr. Gokul Kumar
Georgia Institute of Technology
Verified email at micron.com
Title
Cited by
Cited by
Year
3D-MAPS: 3D massively parallel processor with stacked memory
SK Lim, SK Lim
Design for High Performance, Low Power, and Reliable 3D Integrated Circuits …, 2013
2222013
Design, fabrication, and characterization of ultrathin 3-D glass interposers with through-package-vias at same pitch as TSVs in silicon
V Sukumaran, G Kumar, K Ramachandran, Y Suzuki, K Demir, Y Sato, ...
IEEE Transactions on Components, Packaging and Manufacturing Technology 4 (5 …, 2014
1262014
Design and analysis of 3D-MAPS (3D massively parallel processor with stacked memory)
DH Kim, K Athikulwongse, MB Healy, MM Hossain, M Jung, I Khorosh, ...
IEEE Transactions on Computers 64 (1), 112-125, 2013
802013
Ultra-high I/O density glass/silicon interposers for high bandwidth smart mobile applications
G Kumar, T Bandyopadhyay, V Sukumaran, V Sundaram, SK Lim, ...
2011 IEEE 61st Electronic Components and Technology Conference (ECTC), 217-223, 2011
592011
Low-cost and low-loss 3D silicon interposer for high bandwidth logic-to-memory interconnections without TSV in the logic IC
V Sundaram, Q Chen, Y Suzuki, G Kumar, F Liu, R Tummala
2012 IEEE 62nd Electronic Components and Technology Conference, 292-297, 2012
442012
Modeling, fabrication, and characterization of low-cost and high-performance polycrystalline panel-based silicon interposer with through vias and redistribution layers
Q Chen, Y Suzuki, G Kumar, V Sundaram, RR Tummala
IEEE Transactions on Components, Packaging and Manufacturing Technology 4 …, 2014
252014
Design and demonstration of power delivery networks with effective resonance suppression in double-sided 3-D glass interposer packages
G Kumar, S Sitaraman, J Cho, V Sundaram, J Kim, RR Tummala
IEEE Transactions on components, packaging and manufacturing technology 6 (1 …, 2015
172015
Dengue maculopathy: a case report
SY Tan, G Kumar, SK Surrun, YY Ong
Travel Medicine and Infectious Disease 5 (1), 62-63, 2007
122007
Aggressively voltage overscaled adaptive RF systems using error control at the bit and symbol levels
J Natarajan, G Kumar, S Sen, MM Nisar, D Lee, A Chatterjee
2009 15th IEEE International On-Line Testing Symposium, 249-254, 2009
92009
Power delivery network analysis of 3D double-side glass interposers for high bandwidth applications
G Kumar, S Sitaraman, J Cho, SJ Kim, V Sundaram, J Kim, R Tummala
2013 IEEE 63rd Electronic Components and Technology Conference, 1100-1108, 2013
82013
Shreepad Panth
DH Kim, K Athikulwongse, MB Healy, M Hossain, M Jung, I Khorosh, ...
Mohit Pathak, Minzhen Ren, Guanhao Shen, Taigon Song, Dong Hyuk Woo, Xin …, 2012
82012
Coaxial through-package-vias (TPVs) for enhancing power integrity in 3D double-side glass interposers
G Kumar, PM Raj, J Cho, S Gandhi, P Chakraborti, V Sundaram, J Kim, ...
2014 IEEE 64th Electronic Components and Technology Conference (ECTC), 541-547, 2014
72014
Modeling and design of an ultra-miniaturized WLAN sub-system with chip-last embedded PA and digital dies
G Kumar, S Sitaraman, V Sridharan, N Sankaran, F Liu, N Kumbhat, ...
2012 IEEE 62nd Electronic Components and Technology Conference, 1015-1022, 2012
42012
Physics-driven Regression Algorithm on Solder Joint Fatigue Life Prediction for Mobile SiP Packages
FX Che, YC Ong, HW Ng, L Pan, K Sinha, C Glancey, G Kumar
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC), 420-425, 2023
22023
Modeling, design, fabrication and characterization of power delivery networks and resonance suppression in double-sided 3-D glass interposer packages
G Kumar
Ph. D. dissertation, Electrical and Computer Engineering, Georgia Institute …, 2015
22015
3D Glass and Silicon Interposers with TPV vs. 3D ICs with TSV
R Tummala
Additional Papers and Presentations 2012 (DPC), 000757-000790, 2012
12012
Significance of Die Shadow Size and Placement on Solder Joint Reliability Performance
BR Korpati, PNV Nune, K Sinha, C Glancey, G Kumar, YC Ong, HW Ng
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024
2024
Leakage current based Thermal Design Approach for SSD Reliability
R Nallavelli, PNV Nune, SR Yarragunta, C Glancey, G Kumar, YC Ong, ...
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024
2024
Methodology of Artificial Intelligence Aided Hybrid Modeling for Predicting Solder Joint Reliability of BGA Package
L Pan, F Che, YC Ong, HW Ng, C Glancey, G Kumar
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC), 1200-1204, 2023
2023
Solar PV Application in Industrial Conveyor System
PP Raj, NR Pochont, KMVR Teja, GD Kumar
IOP Conference Series: Earth and Environmental Science 573 (1), 012046, 2020
2020
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