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Yongfa Fan
Yongfa Fan
ASML US Inc
Verified email at asml.com
Title
Cited by
Cited by
Year
Water immersion optical lithography for the 45-nm node
BW Smith, H Kang, A Bourov, F Cropanese, Y Fan
Optical Microlithography XVI 5040, 679-689, 2003
772003
Mask-induced polarization effects at high numerical aperture
A Estroff, Y Fan, A Bourov, B Smith
Journal of Micro/Nanolithography, MEMS and MOEMS 4 (3), 031107-031107-8, 2005
65*2005
Approaching the numerical aperture of water immersion lithography at 193-nm
BW Smith, A Bourov, Y Fan, LV Zavyalova, NV Lafferty, FC Cropanese
Optical Microlithography XVII 5377, 273-284, 2004
612004
25 nm immersion lithography at 193 nm wavelength
BW Smith, Y Fan, M Slocum, L Zavyalova
Optical Microlithography XVIII 5754, 141-147, 2005
602005
Water immersion optical lithography at 193 nm
BW Smith, A Bourov, H Kang, F Cropanese, Y Fan, N Lafferty, ...
Journal of Micro/Nanolithography, MEMS and MOEMS 3 (1), 44-51, 2004
522004
Evanescent wave imaging in optical lithography
BW Smith, Y Fan, J Zhou, N Lafferty, A Estroff
Optical microlithography XIX 6154, 100-108, 2006
452006
Novel glass-forming liquid crystals. 6. High-temperature glassy nematics
FY Fan, SW Culligan, JC Mastrangelo, D Katsis, SH Chen, TN Blanton
Chemistry of materials 13 (12), 4584-4594, 2001
442001
Doping competition of anions during the electropolymerization of pyrrole in aqueous solutions
Y Li, Y Fan
Synthetic metals 79 (3), 225-227, 1996
431996
Immersion microlithography at 193 nm with a Talbot prism interferometer
A Bourov, Y Fan, FC Cropanese, NV Lafferty, LV Zavyalova, H Kang, ...
Optical Microlithography XVII 5377, 1573-1578, 2004
372004
Immersion lithography fluids for high NA 193 nm lithography
J Zhou, Y Fan, A Bourov, N Lafferty, F Cropanese, L Zavyalova, A Estroff, ...
Optical Microlithography XVIII 5754, 630-637, 2005
312005
Amphibian XIS: an immersion lithography microstepper platform
BW Smith, A Bourov, Y Fan, F Cropanese, P Hammond
Optical Microlithography XVIII 5754, 751-759, 2005
282005
Study of air-bubble-induced light scattering effect on image quality in 193-nm immersion lithography
Y Fan, NV Lafferty, A Bourov, LV Zavyalova, BW Smith
Optical Microlithography XVII 5377, 477-486, 2004
232004
Edge-based full chip mask topography modeling
Q Yan, H Zhang, E Croffie, L Zhang, Y Fan, P Brooker, Q Ren
US Patent 8,918,743, 2014
212014
Inorganic immersion fluids for ultrahigh numerical aperture 193 nm lithography
J Zhou, Y Fan, A Bourov, BW Smith
Applied optics 45 (13), 3077-3082, 2006
192006
ILSim: a compact simulation tool for interferometric lithography
Y Fan, A Bourov, L Zavyalova, J Zhou, A Estroff, N Lafferty, BW Smith
Optical Microlithography XVIII 5754, 1805-1816, 2005
192005
Novel glass-forming liquid crystals V. Nematic and chiral-nematic systems with an elevated glass transition temperature
FY Fan, JC Mastrangelo, D Katsis, SH Chen
Liquid Crystals 27 (9), 1239-1248, 2000
172000
3D resist profile modeling for OPC applications
Y Fan, KK Koh, Q Yang, W Hoppe, B Kuechler, P Perampalam, M Miyagi, ...
Optical Microlithography XXVI 8683, 401-411, 2013
152013
Integrated mask and optics simulations for mask corner rounding effect in OPC modeling
J Xue, Z Deng, K Koo, J Shiely, S Lee, Y Zhang, Y Fan, T Schmoeller
Photomask Technology 2010 7823, 1022-1032, 2010
152010
Hyper NA water immersion lithography at 193nm and 248nm
BW Smith, Y Fan, J Zhou, A Bourov, L Zavyalova, N Lafferty, F Cropanese, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2004
152004
Assist feature placement based on a focus-sensitive cost-covariance field
LD Barnes, BD Painter, Q Yan, Y Fan, J Li, A Poonawala
US Patent 7,954,071, 2011
142011
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