| Introduction to nitride semiconductor blue lasers and light emitting diodes S Nakamura, SF Chichibu CRC Press, 2000 | 756 | 2000 |
| Backside localization of open and shorted IC interconnections EIJ Cole, P Tangyunyong, DL Barton 1998 IEEE International Reliability Physics Symposium Proceedings. 36th …, 1998 | 135 | 1998 |
| Novel failure analysis techniques using photon probing with a scanning optical microscope EI Cole, JM Soden, JL Rife, DL Barton, CL Henderson Proceedings of 1994 IEEE International Reliability Physics Symposium, 388-398, 1994 | 131 | 1994 |
| AlGaN/InGaN/GaN blue light emitting diode degradation under pulsed current stress M Osiński, J Zeller, PC Chiu, B Scott Phillips, DL Barton Applied physics letters 69 (7), 898-900, 1996 | 109 | 1996 |
| Failure analysis of integrated circuits: tools and techniques LC Wagner Springer Science & Business Media, 1999 | 99 | 1999 |
| Microelectronic failure analysis: desk reference RJ Ross, C Boit, D Staab (No Title), 2011 | 97 | 2011 |
| Single-quantum well InGaN green light emitting diode degradation under high electrical stress DL Barton, M Osinski, P Perlin, PG Eliseev, J Lee Microelectronics Reliability 39 (8), 1219-1227, 1999 | 91 | 1999 |
| TIVA and SEI developments for enhanced front and backside interconnection failure analysis EI Cole Jr, P Tangyunyong, DA Benson, DL Barton Microelectronics Reliability 39 (6-7), 991-996, 1999 | 88 | 1999 |
| Infrared light emission from semiconductor devices DL Barton, P Tangyunyong, JM Soden, AY Liang, FJ Low, AN Zaplatin, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 1996 | 81 | 1996 |
| Life tests and failure mechanisms of GaN/AlGaN/InGaN light emitting diodes DL Barton, M Osinski, P Perlin, CJ Helms, NH Berg 1997 IEEE International Reliability Physics Symposium Proceedings. 35th …, 1997 | 76 | 1997 |
| Fluorescent microthermal imaging—theory and methodology for achieving high thermal resolution images DL Barton, P Tangyunyong Microelectronic Engineering 31 (1-4), 271-279, 1996 | 70 | 1996 |
| FLIP-chip and “backside” techniques DL Barton, K Bernhard-Höfer, EI Cole Jr Microelectronics Reliability 39 (6-7), 721-730, 1999 | 42 | 1999 |
| Capacitive charge generation apparatus and method for testing circuits EI Cole Jr, KA Peterson, DL Barton US Patent 5,781,017, 1998 | 39 | 1998 |
| Transient power supply voltage (V/sub DDT/) analysis for detecting IC defects EI Cole, JM Soden, P Tangyunyong, PL Candelaria, RW Beegle, ... Proceedings International Test Conference 1997, 23-31, 1997 | 28 | 1997 |
| Degradation of blue AlGaN/InGaN/GaN LEDs subjected to high current pulses DL Barton, J Zeller, BS Phillips, PC Chiu, S Askar, DS Lee, M Osinski, ... Proceedings of 1995 IEEE International Reliability Physics Symposium, 191-199, 1995 | 25 | 1995 |
| Scanning fluorescent microthermal imaging apparatus and method DL Barton, P Tangyunyong US Patent 5,705,821, 1998 | 24 | 1998 |
| Flip Chip and “Backside” Sample Preparation Techniques D Barton, E Cole Jr, K Bernhard-Höfer Microelectronics Failure Analysis Desk Reference, ASM International,, 42-48, 2004 | 17 | 2004 |
| Wavefront coded imaging systems for mems analysis DL Barton, JA Walraven, ER Dowski Jr, R Danz, A Faulstich, ... International Symposium for Testing and Failure Analysis 30774, 295-303, 2002 | 17 | 2002 |
| Effects of high electrical stress on GaN/InGaN/AlGaN single-quantum-well light-emitting diodes M Osiński, DL Barton, P Perlin, J Lee Journal of crystal growth 189, 808-811, 1998 | 17 | 1998 |
| Degradation mechanisms in GaN/AlaN/InGaN LEDs and LDs DL Barton, M Osinski Semiconducting and Insulating Materials 1998. Proceedings of the 10th …, 1998 | 16 | 1998 |
