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Ivan Blum
Ivan Blum
Verified email at univ-rouen.fr
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High-performance bulk thermoelectrics with all-scale hierarchical architectures
K Biswas, J He, ID Blum, CI Wu, TP Hogan, DN Seidman, VP Dravid, ...
Nature 489 (7416), 414-418, 2012
46072012
Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field
L Mancini, N Amirifar, D Shinde, I Blum, M Gilbert, A Vella, F Vurpillot, ...
The Journal of Physical Chemistry C 118 (41), 24136-24151, 2014
1602014
Morphology Control of Nanostructures: Na-Doped PbTe–PbS System
J He, ID Blum, HQ Wang, SN Girard, J Doak, LD Zhao, JC Zheng, ...
Nano letters 12 (11), 5979-5984, 2012
1192012
Correlation of microphotoluminescence spectroscopy, scanning transmission electron microscopy, and atom probe tomography on a single nano-object containing an InGaN/GaN …
L Rigutti, I Blum, D Shinde, D Hernandez-Maldonado, W Lefebvre, ...
Nano letters 14 (1), 107-114, 2014
782014
Simulation of field-induced molecular dissociation in atom-probe tomography: Identification of a neutral emission channel
D Zanuttini, I Blum, L Rigutti, F Vurpillot, J Douady, E Jacquet, ...
Physical Review A 95 (6), 061401, 2017
612017
Three-dimensional nanoscale study of Al segregation and quantum dot formation in GaAs/AlGaAs core-shell nanowires
L Mancini, Y Fontana, S Conesa-Boj, I Blum, F Vurpillot, L Francaviglia, ...
Applied Physics Letters 105 (24), 243106, 2014
562014
Kinetics of a transient silicide during the reaction of Ni thin film with (100) Si
D Mangelinck, K Hoummada, I Blum
Applied Physics Letters 95 (18), 2009
462009
Composition measurement of the Ni-silicide transient phase by atom probe tomography
K Hoummada, I Blum, D Mangelinck, A Portavoce
Applied Physics Letters 96 (26), 261904, 2010
412010
Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events
E Di Russo, I Blum, J Houard, M Gilbert, G Da Costa, D Blavette, L Rigutti
Ultramicroscopy 187, 126-134, 2018
392018
Dopant distributions in PbTe-based thermoelectric materials
ID Blum, D Isheim, DN Seidman, J He, J Androulakis, K Biswas, ...
Journal of electronic materials 41 (6), 1583-1588, 2012
382012
Dissociation Dynamics of Molecular Ions in High DC Electric Field
I Blum, L Rigutti, F Vurpillot, A Vella, A Gaillard, B Deconihout
The Journal of Physical Chemistry A, 2016
372016
Multi-microscopy study of the influence of stacking faults and three-dimensional In distribution on the optical properties of m-plane InGaN quantum wells grown on microwire …
L Mancini, D Hernández-Maldonado, W Lefebvre, J Houard, I Blum, ...
Applied Physics Letters 108 (4), 042102, 2016
342016
Energy deficit of pulsed-laser field-ionized and field-emitted ions from non-metallic nano-tips
L Arnoldi, EP Silaeva, A Gaillard, F Vurpillot, I Blum, L Rigutti, ...
Journal of Applied Physics 115 (20), 203705, 2014
342014
Unraveling the Metastability of Cn2+ (n = 2–4) Clusters
Z Peng, D Zanuttini, B Gervais, E Jacquet, I Blum, PP Choi, D Raabe, ...
The journal of physical chemistry letters 10 (3), 581-588, 2019
322019
Progress in the understanding of Ni silicide formation for advanced MOS structures
D Mangelinck, K Hoummada, F Panciera, M El Kousseifi, I Blum, ...
physica status solidi (a) 211 (1), 152-165, 2014
302014
Composition metrology of ternary semiconductor alloys analyzed by atom probe tomography
E Di Russo, F Moyon, N Gogneau, L Largeau, E Giraud, JF Carlin, ...
The Journal of Physical Chemistry C 122 (29), 16704-16714, 2018
292018
Three-dimensional atomic-scale investigation of ZnO-MgxZn1−xO m-plane heterostructures
E Di Russo, L Mancini, F Moyon, S Moldovan, J Houard, FH Julien, ...
Applied Physics Letters 111 (3), 032108, 2017
292017
Wavelength and shape dependent strong-field photoemission from silver nanotips
MR Bionta, SJ Weber, I Blum, J Mauchain, B Chatel, B Chalopin
New Journal of Physics 18 (10), 103010, 2016
272016
Field-Dependent Measurement of GaAs Composition by Atom Probe Tomography
E Di Russo, I Blum, J Houard, G Da Costa, D Blavette, L Rigutti
Microscopy and Microanalysis 23 (6), 1067-1075, 2017
262017
Electronic structure and stability of the SiO2+ dications produced in tomographic atom probe experiments
D Zanuttini, I Blum, L Rigutti, F Vurpillot, J Douady, E Jacquet, ...
The Journal of Chemical Physics 147 (16), 164301, 2017
232017
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